Pregled bibliografske jedinice broj: 256506
Complementality of nuclear-based analytical techniques for the characterization of thin film technological materials
Complementality of nuclear-based analytical techniques for the characterization of thin film technological materials // CAARI 2006, Program and abstracts
Fort Worth (TX), Sjedinjene Američke Države: University of North Texas, 2006. (predavanje, nije recenziran, sažetak, znanstveni)
CROSBI ID: 256506 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Complementality of nuclear-based analytical techniques for the characterization of thin film technological materials
Autori
Bamford, S ; Kregsamer, P. ; Fazinić, Stjepko ; Jakšić, Milko ; Wegrzynek, D. ; Chinea Cano, E. ; Markowicz, A.
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
CAARI 2006, Program and abstracts
/ - : University of North Texas, 2006
Skup
19th International Conference on the application of accelerators in research and industry
Mjesto i datum
Fort Worth (TX), Sjedinjene Američke Države, 20.08.2006. - 25.08.2006
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Nije recenziran
Ključne riječi
EDXRF; PIXE/RBS; trace elements
Sažetak
Two thin film tehnological materials (A/B) from the aerospace industry have been characterized for their elemental composition, for the purpose of determinating their purity and trace element distribution. The results contribute to the assessment of the materials? suitability for maintaining stable temperature for a chamber in space. Analysis was done using a combination of PIXE/RBS and energy dispersive x-ray fluorescence (EDXRF) analytical techniques. Samples of the materials were analyzed with PIXE/RBS system using 2MeV proton beam from a 1 MV Tandetron accelerator, and also with separate EDXRF systems employing Am-241 and Mo-tube as excitation sources. PIXE/RBS measurements enabled identification of the elemental composition and elucidation of the layer structure of the materials. From the PIXE/RBS results, Am-241-excited EDXRF technique was selected for quantitative determination of indium (In) and tin (Sn) by their K-x-rays, after reasonable absorption corrections. A comparison has been made of the results obtained from EDXRF and PIXE/RBS. Material A has been found to be a thin film with three layers, while material B is a thin film comprising of four layers. Thicknesses and compositions (including trace elements) of all layers have been determined. The limitation of EDXRF in the analysis of inhomogeneously distributed elements was overcome by using PIXE/RBS as an appropriate complimentary technique.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
