Pregled bibliografske jedinice broj: 241806
Istraživanje ortodontskih žica pomoću scanning elektronske mikroskopije i Auger elektronske spektroskopije
Istraživanje ortodontskih žica pomoću scanning elektronske mikroskopije i Auger elektronske spektroskopije // Vacuum, 43 (1992), 5-7; 613-615 (međunarodna recenzija, članak, znanstveni)
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Naslov
Istraživanje ortodontskih žica pomoću scanning elektronske mikroskopije i Auger elektronske spektroskopije
(Investigation of othodontic wires by scanning electron microscopy and Auger electron spectroscopy)
Autori
Ciprus, V. ; Pirš, J. ; Pomenić, L. ; Kern, M. ; Praček, B.
Izvornik
Vacuum (0042-207X) 43
(1992), 5-7;
613-615
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
ortodontske žice; korozija; scanning elektronska mikroskopija; Auger elektronska spektroskopija
(orthodontic wires; corrosion; scanning electron microscopy; Auger electron spectroscopy)
Sažetak
An investigation has been conducted to clarify the possible mechanisms of oxidation and corrosion of orthodontic wires. Orthodontic wires, which are produced from 316L stainless steel are used for the mounting and holding of the active free plate, which is a correction instrument for teeth growth. Orthodontic wires can break during service life and the fracture mode is fatigue failure. The fractured surface is covered with a contaminating layer, varying in thickness. During previous investigations it was shown that the contaminating layer is composed of carbon and sputum products. The chemical composition was determined by using AES. During this investigation the composition of the surface layer on the fracture surface formed ws determined by AES. The results showed that the principal constituents of the surface layer were oxygen, sulphur, calcium and carbon.
Izvorni jezik
Engleski
Znanstvena područja
Temeljne tehničke znanosti
POVEZANOST RADA
Ustanove:
Tehnički fakultet, Rijeka
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus