Pregled bibliografske jedinice broj: 236858
Microwave response of thin niobium films under perpendicular static magnetic fields
Microwave response of thin niobium films under perpendicular static magnetic fields // Physical review. B, Condensed matter and materials physics, 74 (2006), 10; 104501-104507 (međunarodna recenzija, članak, znanstveni)
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Naslov
Microwave response of thin niobium films under perpendicular static magnetic fields
Autori
Janjušević, Dragan ; Grbić, Mihael Srđan ; Požek, Miroslav ; Dulčić, Antonije ; Paar, Dalibor ; Nebendahl, Bernd ; Wagner, Thomas
Izvornik
Physical review. B, Condensed matter and materials physics (1098-0121) 74
(2006), 10;
104501-104507
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Nb thin films ; upper critical fields ; microwave response
Sažetak
The microwave response of high quality niobium films in a perpendicular static magnetic field has been investigated. The complex frequency shift was measured up to the upper critical fields. The data have been analyzed by the effective conductivity model for the type-II superconductors in the mixed state. Thin niobium films can serve as model system for the upper critical field determination of high-$\kappa$ superconducting samples from microwave measurements. The depinning frequency of the thinnest (10\:nm) film is $\approx 20\:\rm{; ; ; ; ; ; ; GHz}; ; ; ; ; ; ; $ due to the surface pinning centers. For samples with high values of depinning frequency, one should measure both components of the complex frequency shift in order to determine the flow resistivity.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Cond-mat/0602168
POVEZANOST RADA
Projekti:
0119275
Ustanove:
Prirodoslovno-matematički fakultet, Zagreb
Profili:
Mihael Srđan Grbić
(autor)
Antonije Dulčić
(autor)
Dragan Janjušević
(autor)
Dalibor Paar
(autor)
Miroslav Požek
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus