Pregled bibliografske jedinice broj: 23656
Droplet formation during laser sputtering of silicon
Droplet formation during laser sputtering of silicon // Applied surface science, 136 (1998), 1-2; 73-80 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 23656 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Droplet formation during laser sputtering of silicon
Autori
Andreić, Željko ; Henč-Bartolić, Višnja ; Gracin, Davor ; Stubičar, Mirko
Izvornik
Applied surface science (0169-4332) 136
(1998), 1-2;
73-80
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Silicon; Hydrodynamical instability; Droplet formation
Sažetak
High-purity single-crystal silicon was ablated with nitrogen laser radiation wavelength 337 nm, pulse length 6 ns, maximal energy density 1.1 J/cm2, nonuniform target energy distribution. Many droplets were observed around the damaged target area, which seem to be ejected out of it and splashed vigorously onto the surrounding target surface. Their diameters are found to be in a range of a micrometer The droplets were most probably produced within a single laser pulse as a result of hydrodynamical instability of the molten surface layer. Intense splashing occurs as a consequence of the large plume pressure generated by the most intense parts of the laser beam. The irregular power distribution on the target seems to enhance droplet formation significantly, since their abundance is drastically lower or even missing in similar experimental conditions but with uniform power distribution.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb
Profili:
Željko Andreić
(autor)
Davor Gracin
(autor)
Višnja Henč-Bartolić
(autor)
Mirko Stubičar
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus