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Pregled bibliografske jedinice broj: 214712

Preparation of the thin samples for alpha particle emission test


Lykken, Glenn, I.; Momčilović, Berislav
Preparation of the thin samples for alpha particle emission test
Hrvatski patentni glasnik 2 (2003) 120.


CROSBI ID: 214712 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Preparation of the thin samples for alpha particle emission test

Autori
Lykken, Glenn, I. ; Momčilović, Berislav

Broj patenta
US4, 584.161

Godina
2003

Datum patenta
16.12.2004.

Sažetak
Lead is the principal soldering material in computer chip manufacturing today. However, commercially available lead is contaminated by the radioactive radon and its daughters ; some of them have a considerably energy (>5 MeV)sufficient enough to induce the computer chip "soft error". Since the computer chips are getting smaller and smaller, such "soft errors" occure more and more often. Therefore, it is absolutely necessary to have a workable metrology for measuring the rare events of radon family radioactive chain decay to assess accurately the risk of error for such sophisticated systems like IBM, deep space probes, and Homeland Security.

Izvorni jezik
Engleski



POVEZANOST RADA


Projekti:
0022013

Ustanove:
Institut za medicinska istraživanja i medicinu rada, Zagreb

Profili:

Avatar Url Berislav Momčilović (autor)


Citiraj ovu publikaciju:

Lykken, Glenn, I.; Momčilović, Berislav
Preparation of the thin samples for alpha particle emission test
Hrvatski patentni glasnik 2 (2003) 120.
Lykken, Glenn, I. & Momčilović, B. (2003) Preparation of the thin samples for alpha particle emission test, US4, 584.161.
@patent{patent, author = {Mom\v{c}ilovi\'{c}, Berislav}, year = {2003}, keywords = {}, title = {Preparation of the thin samples for alpha particle emission test}, keyword = {} }
@patent{patent, author = {Mom\v{c}ilovi\'{c}, Berislav}, year = {2003}, keywords = {}, title = {Preparation of the thin samples for alpha particle emission test}, keyword = {} }




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