Pregled bibliografske jedinice broj: 214712
Preparation of the thin samples for alpha particle emission test
Preparation of the thin samples for alpha particle emission test
Hrvatski patentni glasnik 2 (2003) 120.
CROSBI ID: 214712 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Preparation of the thin samples for alpha particle emission test
Autori
Lykken, Glenn, I. ; Momčilović, Berislav
Broj patenta
US4, 584.161
Godina
2003
Datum patenta
16.12.2004.
Sažetak
Lead is the principal soldering material in computer chip manufacturing today. However, commercially available lead is contaminated by the radioactive radon and its daughters ; some of them have a considerably energy (>5 MeV)sufficient enough to induce the computer chip "soft error". Since the computer chips are getting smaller and smaller, such "soft errors" occure more and more often. Therefore, it is absolutely necessary to have a workable metrology for measuring the rare events of radon family radioactive chain decay to assess accurately the risk of error for such sophisticated systems like IBM, deep space probes, and Homeland Security.
Izvorni jezik
Engleski
POVEZANOST RADA
Projekti:
0022013
Ustanove:
Institut za medicinska istraživanja i medicinu rada, Zagreb
Profili:
Berislav Momčilović
(autor)