Pregled bibliografske jedinice broj: 211876
Automatic Inspection of Defects in Plain and Texture Surfaces
Automatic Inspection of Defects in Plain and Texture Surfaces // Proceedings of the 2001 IEEE International Conference on Intelligent Engineering Systems (INES 2001) / Patkai, Bela ; Rudas, Imre J. (ur.).
Tampere: Institute of Production Engineering, Tampere University of Technology, 2001. str. 221-227 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Automatic Inspection of Defects in Plain and Texture Surfaces
Autori
Hocenski, Željko ; Rimac-Drlje, Snježana ; Keser, Tomislav
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 2001 IEEE International Conference on Intelligent Engineering Systems (INES 2001)
/ Patkai, Bela ; Rudas, Imre J. - Tampere : Institute of Production Engineering, Tampere University of Technology, 2001, 221-227
Skup
IEEE International Conference on Intelligent Engineering Systems
Mjesto i datum
Helsinki, Finska, 16.09.2001. - 18.09.2001
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
inspection ; defects ; image processing ; tiles ; discrete transform ; wavelet
Sažetak
The image processing used for visual inspection and quality control in a serial production is described in this paper. We used the discrete wavelet transform - DWT in our failure detection algorithm. To achieve robustness as well as good sensitivity of the algorithm, we divide the images into segments. The difference of the wavelet coefficients maxima for the given segment for images of the tile with and without defects was used for defect detection. The analysis of detection capabilities is done for different segment sizes, different detection sensitivity levels - DSL and for two orthogonal wavelets.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika, Računarstvo