Pregled bibliografske jedinice broj: 21015
Evaluation of Fault Detection and Fault Recovery of Microcontroller Dyad by Fault Injection
Evaluation of Fault Detection and Fault Recovery of Microcontroller Dyad by Fault Injection // Proceedings of the 20th International Conference on Information Technology Interfaces / Damir Kalpić ; Vesna Hljuz Dobrić (ur.).
Zagreb: Sveučilišni računski centar Sveučilišta u Zagrebu (Srce), 1998. str. 283-288 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Evaluation of Fault Detection and Fault Recovery of Microcontroller Dyad by Fault Injection
Autori
Hocenski, Željko ; Martinović, Goran
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 20th International Conference on Information Technology Interfaces
/ Damir Kalpić ; Vesna Hljuz Dobrić - Zagreb : Sveučilišni računski centar Sveučilišta u Zagrebu (Srce), 1998, 283-288
Skup
20th International Conference on Information Technology Interfaces
Mjesto i datum
Pula, Hrvatska, 16.06.1998. - 19.06.1998
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
microcontroller; fault tolerance; fault injection; fault coverage; evaluation
Sažetak
Microcontrollers in dyad are used for increased reliability and fault tolerance. Depending on two types of software the behaviour of such system could be for increased persistency or for increased integrity. Redundancy is incorporated in software in form of time redundancy, data multiplication, retry etc. Microcontrollers in dyad are loosely coupled with task synchronisation. The evaluation of used fault tolerant methods is done by experiments using the fault injection method. The fault injection system is based on a personal computer, which controls the execution of the experiment and collects the results. The activity of the bus signals is used in calculation of the probability of the fault occurrence. The fault recovery coverage is evaluated using the registered number of faults and the probability of the fault occurrence.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika