Pregled bibliografske jedinice broj: 189528
X-ray photoelectron spectroscopy of thermally treated TiO2 thin films
X-ray photoelectron spectroscopy of thermally treated TiO2 thin films // Applied surface science, 68 (1993), 4; 477-479 doi:10.1016/0169-4332(93)90229-5 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 189528 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
X-ray photoelectron spectroscopy of thermally treated TiO2 thin films
Autori
Turković, Aleksandra ; Šokčević, Damir
Izvornik
Applied surface science (0169-4332) 68
(1993), 4;
477-479
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
XPS ; titanium dioxide ; thin film
Sažetak
Thin polycrystalline films of TiO2 obtained by the chemical vapour deposition method have been examined by X-ray photoelectron spectroscopy (XPS) before and after thermal annealing in vacuum at temperatures from 300 to 900 oC. In the temperature range from 25 to 800 oC we have found carbon to be the dominant impurity at the surface of the film.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
