Pregled bibliografske jedinice broj: 18825
The persistent correlation effects in double ionization of helium like atoms or ions which are probed with high energy photons
The persistent correlation effects in double ionization of helium like atoms or ions which are probed with high energy photons // Journal of the Korean Physical Society, 32 (1998), 356-364 (međunarodna recenzija, članak, znanstveni)
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Naslov
The persistent correlation effects in double ionization of helium like atoms or ions which are probed with high energy photons
Autori
Pratt, R.H. ; Surić, Tihomir ; Pisk, Krunoslav
Izvornik
Journal of the Korean Physical Society (0374-4884) 32
(1998);
356-364
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Sažetak
We analyze the correlation effects in two electron atoms and ions which can be probed in double ionization with high energy photons.
We consider total cross sections and differential cross sections for double ionization by photoabsorption and Compton scattering
and discuss the shake and non--shake
mechanisms which may contribute to these observables. The total cross section
for photoabsorption (at high energies) is determined by two mechanisms, the shake--off mechanism and a quasi--equal--energy sharing mechanism, while for Compton scattering it is determined by the shake--off mechanism.
In general the shake--off mechanism probes different distances in the two processes, so that the shake--off ratios are different. Analyzing differential cross sections, we are able to distinguish the shake from the non--shake contributions in photoabsorption, or the variation of shake--off result with distance probed in Compton scattering. We discuss the utilization of the double ionization Compton profile (as distinguished from the ordinary Compton profile) for studying the correlation effects in Helium.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus