Pregled bibliografske jedinice broj: 167517
The IAEA PIXE/RBS facility: developments and applications
The IAEA PIXE/RBS facility: developments and applications // Proceedings of the 10th International Conference on Particle Induced X-Ray Emission And its Analytical Applications
Ljubljana, 2004. str. 404.1-404.3 (predavanje, nije recenziran, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 167517 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
The IAEA PIXE/RBS facility: developments and applications
Autori
Bamford, S. ; Jakšić, Milko ; Bogdanović Radović, Ivančica ; Bogovac, Mladen ; Markowicz, A. ; Chinea-Cano, E. ; Wegrzynek, D.
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 10th International Conference on Particle Induced X-Ray Emission And its Analytical Applications
/ - Ljubljana, 2004, 404.1-404.3
Skup
10th International Conference on Particle Induced X-Ray Emission And its Analytical Applications
Mjesto i datum
Portorož, Slovenija; Ljubljana, Slovenija, 04.06.2004. - 08.06.2004
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Nije recenziran
Ključne riječi
PIXE; RBS
Sažetak
A dedicated PIXE/RBS beam line at the Tandem Van de Graaff accelerator of the Ruder Boskovic Institute in Zagreb, Croatia, has been equipped by the International Atomic Energy (IAEA) in order to provide both training and analytical support services to Agency laboratories in Seibersdorf and to some member countries of the IAEA. This paper describes new developments and some recent applications carried out on the beamline. The new user-friendly, multi-parameter data acquisition software SPECTOR is capable of collecting and displaying data simultaneously from several ADC’ s, while controlling also sample positioning and detectors’ power up. The software also features various useful analysis and display tools. Precise sample positioning has been ensured by developing a 16-position, rotating, and automatic sample changer that is controlled remotely. Each sample position can be fine-tuned with the aid of an installed camera in the chamber. In the routine analytical applications by PIXE and RBS, the sample matrix is independently estimated using the RBS technique, and the results provided as an input for the PIXE analysis. Consequently, the influence of the proton elastic scattering database at 3 MeV and 165 degree scatter angle on the accuracy of analysis, is discussed here in case of typical thick samples analyzed by PIXE. The RBS results were also provided as an input (after an one time a priori determination) to conventional tube-excited x-ray fluorescence spectrometry in extending and improving quantitative analysis of plant-based samples. Results of analysis of aerosol-loaded filters from an industrial area, and samples from different species of tropical timber are also presented. Even though the acquisition of a PIXE/RBS facility may be out of the financial reach of many laboratories in developing countries, the above collaboration in the use of an already established facility provides access and maximises the use of an accelerator-based analytical technique.
Izvorni jezik
Engleski
Znanstvena područja
Fizika