Pregled bibliografske jedinice broj: 16497
Energy straggling induced errors in heavy-ion PIXE analysis
Energy straggling induced errors in heavy-ion PIXE analysis // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138 (1998), 179-183 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 16497 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Energy straggling induced errors in heavy-ion PIXE analysis
Autori
Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Fujii, K. ; Jakšić, Milko
Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 138
(1998);
179-183
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Heavy-ion. Pixe. Straggling. Ecpssr. K lines
Sažetak
Numerical calculations of the heavy-ion energy straggling influence on quantitative heavy-ion PIXE analysis are presented. Heavy ion electronic straggling was calculated using semi-empirical model of Yang. Since heavy ion nuclear straggling is significant and in some cases larger than the electronic one, it has also been included into the calculations. Energy variations of K ionization cross sections were calculated using the ECPSSRmodel. Results for heavy ions are compared with those for protons, for the case of heavy element analysis in a light matrix and for the case of light element analysis in a heavy matrix. Implications on the quantitative heavy ion PIXE analysis are discussed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
