Naslov
The mechanism of lifetime extension due to CuPc layer in organic light emitting diodes,

Autori
Tutiš, Eduard E. ; Berner, Detlef ; Zuppiroli, Libero

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of SPIE, vol 5465 Organic Photoelectronics and Photonics / P.L. Heremans, M. Muccini, H.Hofstraat - Bellingham (WA) : SPIE, 2004, 330-336

Skup
Photonics Europe 2004.

Mjesto i datum
Strasbourg, Francuska, 21.04.2004. - 23.04.2004

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
degradation; roughness; electrode; organic molecular meterial; injection
(degradation; roughess; electrode; organic molecular meterial; injectino)

Sažetak
The remarkable effect on lifetime improvement of copper phthalocianine (CuPc) coated indium tin oxide (ITO) anode of organic light emitting diodes (OLED's) is experimentally well approved. Also known are the electrode morphology, with and without CuPc coating, the energy levels of the used materials, important for charge injection and conduction, the carrier mobility etc. Based on this knowledge we suggest the model that explains the mechanism behind the lifetime improvement. We argue that the charge accumulation at the interface between the CuPc and the hole transport layer is responsible for screening out of the electric field variations leading to current density homogenization across the OLED surface. The variation of the injection field, introduced by electrode roughness, is estimated for typical indium tin oxide morphology used in OLED production. Without the CuPc hole injection layer a substantial current channeling occurs in OLED's, leading to accelerated device degradation.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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