Pregled bibliografske jedinice broj: 15888
Geometrical aberrations in the von Hamos and the plane Bragg crystal spectrometers
Geometrical aberrations in the von Hamos and the plane Bragg crystal spectrometers // International journal of PIXE, 7 (1997), 3, 4; 117-133 (podatak o recenziji nije dostupan, članak, znanstveni)
CROSBI ID: 15888 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Geometrical aberrations in the von Hamos and the plane Bragg crystal spectrometers
Autori
Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Jakšić, Milko
Izvornik
International journal of PIXE (0129-0835) 7
(1997), 3, 4;
117-133
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Sažetak
Numerical calculations of the effect of the finite dimensions and orientations of source and crystal are presented for plane and von Hamos Bragg crystal are presented for plane and von Hamos Bragg crystal spectrometers for , combined with a position sensitive (X-ray) detector. Analytical studies of all effects are provided. It is shown that some parameters can produce line shift and asymmetries. A numerical model for an X-ray diffraction ray-tracing procedure for a crystal Bragg spectrometer is described.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
