Pregled bibliografske jedinice broj: 152347
Investigation on the electric field profile in CdTe by ion beam induced current
Investigation on the electric field profile in CdTe by ion beam induced current // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 380 (1996), 1-2; 136-140 doi:10.1016/S0168-9002(96)00294-X (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 152347 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Investigation on the electric field profile in CdTe by ion beam induced current
Autori
Manfredotti, C. ; Fizzotti, F. ; Polesello, P. ; Trapani, P.P. ; Vittone, Ettore ; Jakšić, Milko ; Fazinić, Stjepko ; Bogdanović, Ivančica
Izvornik
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (0168-9002) 380
(1996), 1-2;
136-140
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
CdTe detector ; IBIC
Sažetak
The charge collection efficiency profile along the thickness of a CdTe detector was measured for first time by using a proton microbeam and a polished cross-section of the devices. Different samples were investigated and tests were carried out along different lines from cathode to anode, with different biases and polarities, and with different shaping times. The effects of all these parameters are evident in the experimental curves. By fitting these curves, the behaviour of the drift length for electrons and holes is obtained, if a constant ratio between them is assumed. If the mobilities and trapping times are uniform, the electric field profile is obtained. The profile has a minimum at the anode and a maximum towards the cathode, at least for large bias voltage.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus