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Pregled bibliografske jedinice broj: 1455

Infrared study of oxygen segregation at structural defects in polycrystalline silicon

Pivac, Branko; Sassella, Adele; Borghesi, Alessandro
Infrared study of oxygen segregation at structural defects in polycrystalline silicon // Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference / Mink, János ; Keresztury, Gábor ; Kellner, Robert (ur.).
Beč: Springer, 1997. str. 485-487 doi:10.1007/978-3-7091-6840-0_116 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)

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Naslov
Infrared study of oxygen segregation at structural defects in polycrystalline silicon

Autori
Pivac, Branko ; Sassella, Adele ; Borghesi, Alessandro

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference / Mink, János ; Keresztury, Gábor ; Kellner, Robert - Beč : Springer, 1997, 485-487

ISBN
978-3-7091-6840-0

Skup
10th International Conference on Fourier Transform Spectroscopy (ICOFTS)

Mjesto i datum
Budimpešta, Mađarska, 27.08.1995. - 01.09.1995

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
polycrystalline silicon ; structural defects ; oxygen-doped silicon ; FT-IR spectroscopy

Sažetak
We have studied oxygen- and carbon-doped multicrystalline silicon samples. It was shown that a significant part of the oxygen incorporated into the samples was accumulated at extended structural defects and therefore could not be quantified. Furthermore, we demonstrated that oxygen was accumulated in SiOx clusters, with x close to 1. This explains the changes in the IR spectrum of the samples after thermal annealing, related to the dissolution of such clusters.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
00980301

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Branko Pivac (autor)

Poveznice na cjeloviti tekst rada:

doi link.springer.com

Citiraj ovu publikaciju:

Pivac, Branko; Sassella, Adele; Borghesi, Alessandro
Infrared study of oxygen segregation at structural defects in polycrystalline silicon // Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference / Mink, János ; Keresztury, Gábor ; Kellner, Robert (ur.).
Beč: Springer, 1997. str. 485-487 doi:10.1007/978-3-7091-6840-0_116 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Pivac, B., Sassella, A. & Borghesi, A. (1997) Infrared study of oxygen segregation at structural defects in polycrystalline silicon. U: Mink, J., Keresztury, G. & Kellner, R. (ur.)Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference doi:10.1007/978-3-7091-6840-0_116.
@article{article, author = {Pivac, Branko and Sassella, Adele and Borghesi, Alessandro}, year = {1997}, pages = {485-487}, DOI = {10.1007/978-3-7091-6840-0\_116}, keywords = {polycrystalline silicon, structural defects, oxygen-doped silicon, FT-IR spectroscopy}, doi = {10.1007/978-3-7091-6840-0\_116}, isbn = {978-3-7091-6840-0}, title = {Infrared study of oxygen segregation at structural defects in polycrystalline silicon}, keyword = {polycrystalline silicon, structural defects, oxygen-doped silicon, FT-IR spectroscopy}, publisher = {Springer}, publisherplace = {Budimpe\v{s}ta, Ma\djarska} }
@article{article, author = {Pivac, Branko and Sassella, Adele and Borghesi, Alessandro}, year = {1997}, pages = {485-487}, DOI = {10.1007/978-3-7091-6840-0\_116}, keywords = {polycrystalline silicon, structural defects, oxygen-doped silicon, FT-IR spectroscopy}, doi = {10.1007/978-3-7091-6840-0\_116}, isbn = {978-3-7091-6840-0}, title = {Infrared study of oxygen segregation at structural defects in polycrystalline silicon}, keyword = {polycrystalline silicon, structural defects, oxygen-doped silicon, FT-IR spectroscopy}, publisher = {Springer}, publisherplace = {Budimpe\v{s}ta, Ma\djarska} }

Časopis indeksira:


  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
    • Conference Proceedings Citation Index - Science (CPCI-S)

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