Pregled bibliografske jedinice broj: 143684
Spectroscopic characterization of nanocrystalline V/Ce oxsides for novel counter electrodes
Spectroscopic characterization of nanocrystalline V/Ce oxsides for novel counter electrodes // Nanostructures: Synthesis, Functional Properties and Applications : Proceedings of the NATO Advanced Study Institute / Tsakalakos, Thomas ; Ovid´ko, Ilya A., Vasudevan, Asuri K (ur.).
Dordrecht: Kluwer Academic Publishers, 2003. str. 441-447 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Spectroscopic characterization of nanocrystalline V/Ce oxsides for novel counter electrodes
Autori
Crnjak Orel, Zorica ; Turković, Aleksandra
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Nanostructures: Synthesis, Functional Properties and Applications : Proceedings of the NATO Advanced Study Institute
/ Tsakalakos, Thomas ; Ovid´ko, Ilya A., Vasudevan, Asuri K - Dordrecht : Kluwer Academic Publishers, 2003, 441-447
Skup
NATO Advanced Study Institute
Mjesto i datum
Grčka, 29.06.2001. - 09.07.2001
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
V/Ce oxide; sol-gel; GISAXS; GIXR; GIWAXD
Sažetak
Thin films of pure V and mixed (V/Ce) oxides at 78, 55, 38 and 32 at% of V were obtained via sol-gel process by dip-coated method which is well known synthetic route for preparation of various oxide and mixed oxides materials. All films were investigated by cyclic voltammetry CV, UV-VIS technique, FT-IR and Raman spectroscopy, atomic force microscopy (AFM), grazing incidence X-ray reflectivity (GIXR), grazing-incidence small-angle X-ray scattering (GISAXS) and grazing-incidence wide-angle diffraction (GIWAXD).
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
