Naslov
Synchrotron light scattering on nanostructured V/Ce oxide films intercalated with Li+ions

Autori
Turković, Aleksandra ; Dubček, Pavo ; Crnjak Orel, Zorica ; Bernstdorff, Sigrid

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Catalogue of Posters, EuroNanoForum 2003, European and International Forum on Nanotechnology, Trieste (Italy), 9-12 December 2003 / Sfiligoj, Antonio - Trst : Europska komisija, 2003

Skup
EuroNanoForum 2003, European and International Forum on Nanotechnology, Trieste (Italy), 9-12 December 2003

Mjesto i datum
Trst, Italija, 09.12.2003. - 12.12.2003

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
GIXR; GISAXS; V/Ce oxides; Dip-coating

Sažetak
Vanadium oxide, such as V2O5, has been extensively studied because it tends to form a lamellar structure that allows the intercalation/de-intercalation of different ions between its layers. It can be used as a catalyst, in electrochromic devices, in an advanced electrochemical cell concept, especially in lithium batteries [1]. The addition of cerium improved stability of vanadium oxide with the ion-charge capacity (up to 30 mC cm-2). The intercalation of Li+ ions in V/Ce films was followed by FT-IR spectroscopy in combination with CV measurements at wide potential range [2]. GISAXS (grazing-incidence small-angle x-ray scattering) data for vanadium oxide and V/Ce nanostructured oxide films were taken with a Gabriel type, gas filled 1D and/or 2D detectors at synchrotron ELETTRA, Trieste. GISAXS data for V2O5 and mixed V/Ce oxides were taken in a sequence of fixed grazing angles [3, 4]. GIXR (grazing-incidence x-ray reflectivity) analyse revealed layers thickness. The average grain radius <R> obtained by GISAXS was correlated with layer thickness. The aim of this work is GISAXS study of grain sizes in vanadium oxide and V/Ce oxide at 38 and 71 at. % of V, which may change upon the intercalation of Li+ ions. References [1] C.G.Granquist, Handbook of Inorganic Electrochromic Materials, Elsevier, Amsterdam, 1995. [2] Z.Crnjak Orel, I.Mušević, Nanostructured Materials 1999, 12: 399. [3] A.Turković, Z.Crnjak Orel, P.Dubček, Materials Science & Engineering B, 2001, 79/1: 11. [4] D.Posedel, A.Turković, P.Dubček and Z.Crnjak Orel, Materials Science & Engineering B, 2002, 90: 154.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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