Pregled bibliografske jedinice broj: 140433
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide // Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil / Fernando Galembeck (ur.).
Campinas: Springer, 2003. (predavanje, međunarodna recenzija, sažetak, znanstveni)
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Naslov
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide
Autori
Crnjak Orel, Zorica ; Kuščer, Danijela ; Kosec, Marija ; Turković, Aleksandra
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil
/ Fernando Galembeck - Campinas : Springer, 2003
Skup
11 th International Conference on Surface and Colloid Science
Mjesto i datum
Slapovi Iguaçu, Brazil, 15.09.2003. - 19.09.2003
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Nano; V2O5; Mixed V/Ce Oxide; Films; Structural analysis; GISAX; TEM
Sažetak
Thin films of vanadium oxide and new, mixed V/Ce-oxide thin films with 55 and 38 at. % of V were prepared on glass substrates covered with SnO2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy (TEM) and grazing-incidence small-angle X-ray scattering (GISAXS). TEM revealed the crystalline structure, with the formation of V2O5 (orthorhombic structure) in all the films. The average grain radius <R>, obtained by (GISAXS), was correlated within the layer thickness.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA