Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 140433

Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide


Crnjak Orel, Zorica; Kuščer, Danijela; Kosec, Marija; Turković, Aleksandra
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide // Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil / Fernando Galembeck (ur.).
Campinas: Springer, 2003. (predavanje, međunarodna recenzija, sažetak, znanstveni)


CROSBI ID: 140433 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide

Autori
Crnjak Orel, Zorica ; Kuščer, Danijela ; Kosec, Marija ; Turković, Aleksandra

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil / Fernando Galembeck - Campinas : Springer, 2003

Skup
11 th International Conference on Surface and Colloid Science

Mjesto i datum
Slapovi Iguaçu, Brazil, 15.09.2003. - 19.09.2003

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Nano; V2O5; Mixed V/Ce Oxide; Films; Structural analysis; GISAX; TEM

Sažetak
Thin films of vanadium oxide and new, mixed V/Ce-oxide thin films with 55 and 38 at. % of V were prepared on glass substrates covered with SnO2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy (TEM) and grazing-incidence small-angle X-ray scattering (GISAXS). TEM revealed the crystalline structure, with the formation of V2O5 (orthorhombic structure) in all the films. The average grain radius <R>, obtained by (GISAXS), was correlated within the layer thickness.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
0098026

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Aleksandra Turković (autor)


Citiraj ovu publikaciju:

Crnjak Orel, Zorica; Kuščer, Danijela; Kosec, Marija; Turković, Aleksandra
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide // Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil / Fernando Galembeck (ur.).
Campinas: Springer, 2003. (predavanje, međunarodna recenzija, sažetak, znanstveni)
Crnjak Orel, Z., Kuščer, D., Kosec, M. & Turković, A. (2003) Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide. U: Fernando Galembeck (ur.)Book of abstract 11 th International Conference on Surface and Colloid Science Sept. !5-19 Falls Iguassu, Brazil.
@article{article, author = {Crnjak Orel, Zorica and Ku\v{s}\v{c}er, Danijela and Kosec, Marija and Turkovi\'{c}, Aleksandra}, year = {2003}, pages = {81}, keywords = {Nano, V2O5, Mixed V/Ce Oxide, Films, Structural analysis, GISAX, TEM}, title = {Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide}, keyword = {Nano, V2O5, Mixed V/Ce Oxide, Films, Structural analysis, GISAX, TEM}, publisher = {Springer}, publisherplace = {slapovi Igua\c{c}u, Brazil} }
@article{article, author = {Crnjak Orel, Zorica and Ku\v{s}\v{c}er, Danijela and Kosec, Marija and Turkovi\'{c}, Aleksandra}, year = {2003}, pages = {81}, keywords = {Nano, V2O5, Mixed V/Ce Oxide, Films, Structural analysis, GISAX, TEM}, title = {Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide}, keyword = {Nano, V2O5, Mixed V/Ce Oxide, Films, Structural analysis, GISAX, TEM}, publisher = {Springer}, publisherplace = {slapovi Igua\c{c}u, Brazil} }




Contrast
Increase Font
Decrease Font
Dyslexic Font