Pregled bibliografske jedinice broj: 132328
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide // Progress in colloid & polymer science, 128 (2004), 99-114 doi:10.1007/b97106 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 132328 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide
Autori
Crnjak Orel, Zorica ; Kuščer, Danijela ; Kosec, Marija ; Turković, Aleksandra
Izvornik
Progress in colloid & polymer science (0340-255X) 128
(2004);
99-114
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
V2O5; TEM; GISAXS
Sažetak
Thin films of vanadium oxide and new mixed V/Ce oxide thin films at 55 and 38 at. % of V were prepared on glass substrate covered with SnO2:F (K-glass) The influence of added cerium precursors as well as influence of substrate material on formation of films were studied in order to connect their the improved intercalation properties for Li ions. The structural properties and morphology of films were determined with transmit ion electron microscopy (TEM) and grazing-incidence small-angle X-ray scattering (GISAXS). With help of TEM the crystalline structure with formation of V2O5 (orthorhombic structure) in all films is observed. The average grain radius <R>, obtained by (GISAXS) was correlated within layer thickness.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Rad je prezentiran na skupu International Conference on Surface and Colloid Science, održanom u rujnu 2003.g., Igaussu Falls, Brazil ; ISBN 3-540-21247-7.
Citiraj ovu publikaciju:
Časopis indeksira:
- Scopus
