Pregled bibliografske jedinice broj: 128568
Ellipsometric and chemical analysis of the interface between silver and oxides, nitrides and fluorides thin films
Ellipsometric and chemical analysis of the interface between silver and oxides, nitrides and fluorides thin films // 3rd International Conference on Spectroscopic Ellipsometry, Program and Abstracts
Beč, 2003. (poster, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 128568 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Ellipsometric and chemical analysis of the interface between silver and oxides, nitrides and fluorides thin films
Autori
Masetti, Enrico ; Gagliardi, Serena ; Janicki, Vesna ; Bulir, Jiri ; Di Sarcina, I. ; Krasilnikova, Anna ; Coluzza, C. ; Di Santo, G.
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
3rd International Conference on Spectroscopic Ellipsometry, Program and Abstracts
/ - Beč, 2003
Skup
3rd International Conference on Spectroscopic Ellipsometry
Mjesto i datum
Beč, Austrija, 06.07.2003. - 11.07.2003
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
ellipsometry; oxides; nitrides; fluorides; thin films
Sažetak
The chemical reactions and diffusion processe at the interference of a metal with oxides and nitrides are a critical issue in the production of metal-dielectric optical filters. The optical properties of these filters depend on the quality of the interfaces between the metal layer and the adjacent dielectric layers. The chemical and physical processes occuring at the silver-dielectric interface are studied by means of ellipsometry and XPS analysis and comprise the subject of the present work.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
