Pregled bibliografske jedinice broj: 1265679
Chemical speciation using WDS in the tender X-ray range
Chemical speciation using WDS in the tender X-ray range // CONFERENCE PROGRAM AND ABSTRACTS: 15th International Conference on Particle Induced X-ray Emission / Fazinić, Stjepko ; Zamboni, Ivana (ur.).
Zagreb: Institut Ruđer Bošković, 2017. str. 32-32 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 1265679 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Chemical speciation using WDS in the tender X-ray range
Autori
Kavčič, Matjaž ; Petric, Marko ; Bohinc, Rok ; Žitnik, Matjaž ; Bučar, Klemen
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
CONFERENCE PROGRAM AND ABSTRACTS: 15th International Conference on Particle Induced X-ray Emission
/ Fazinić, Stjepko ; Zamboni, Ivana - Zagreb : Institut Ruđer Bošković, 2017, 32-32
ISBN
978-953-7941-14-7
Skup
15th International Conference on Particle Induced X-ray Emission
Mjesto i datum
Split, Hrvatska, 02.04.2017. - 07.04.2017
Vrsta sudjelovanja
Pozvano predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
PIXE, WDS, tender x-ray
Sažetak
Wavelength dispersive X-ray spectroscopy (WDS) employing Bragg crystal spectrometers can provide energy resolution on the level of core-hole lifetime broadening of the characteristic emission lines. While WDS has been traditionally used in combination with electron excitation for major and minor element analysis, it has been rarely considered in proton induced X-ray emission (PIXE) trace element analysis mainly due to low detection efficiency. Compared to the simplest flat crystal wavelength dispersive spectrometer the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals in combination with position sensitive X-ray detectors. When such spectrometer is coupled to MeV proton excitation, chemical state analysis can be performed extending the analytical capabilities of PIXE technique also towards chemical speciation. In our laboratory the home-built X-ray emission spectrometer employing cylindrically curved-crystal in Johansson focusing geometry [1]is used to perform high energy resolution PIXE (HR-PIXE) in the tender X- ray range (~2-5 keV). In this contribution the general properties, capabilities as well as limitations of HR-PIXE for chemical speciation in the tender X-ray range will be presented together with some typical results highlighting the analytical potential of such analysis in different research areas.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
