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Pregled bibliografske jedinice broj: 1257257

Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities


Berdalovic, Ivan; Poljak, Mirko; Suligoj, Tomislav
Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities // IEEE Transactions on Electron Devices, 70 (2023), 3; 1425-1429 doi:10.1109/ted.2023.3239057 (međunarodna recenzija, članak, znanstveni)


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Naslov
Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities

Autori
Berdalovic, Ivan ; Poljak, Mirko ; Suligoj, Tomislav

Izvornik
IEEE Transactions on Electron Devices (0018-9383) 70 (2023), 3; 1425-1429

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
2-D electron gas (2DEG) ; charge carrier mobility ; gallium nitride (GaN) ; heterojunctions ; high electron mobility transistors (HEMTs) ; power semiconductor devices ; semiconductor device modeling

Sažetak
In this article, we use a semiclassical low-field mobility modeling framework, which includes all relevant scattering mechanisms, to examine the dependence of electron mobility on 2-D electron gas (2DEG) density in previously characterized high Al-content AlGaN/gallium nitride (GaN) high electron mobility transistors (HEMTs) with and without an AlN spacer layer. Polar optical phonon (POP) scattering has previously been identified as the dominant scattering mechanism in GaN-based HEMTs at room temperature, so the analysis of POP scattering rates is of particular importance. We find that the POP-limited mobility in both structures decreases with increasing 2DEG density up to a critical density of around 10^13 cm^−2 , above which we observe a significant improvement of up to 46% , contrary to the behavior typically reported for GaN HEMT structures. The POP-limited mobility increase is explained by the interplay of ground-state energy and quasi-Fermi energy within the channel, by which intrasubband POP emission within the ground state is suppressed at high 2DEG densities. This provides a universal guideline for the design and operation of GaN-based HEMTs to achieve a minimum ON-resistance in switching applications at room temperature and above.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Elektrotehnika



POVEZANOST RADA


Projekti:
HRZZ-IP-2018-01-5296 - Nova generacija poluvodičkih elemenata i integriranih sklopova za eru Interneta stvari (NexGenSemi) (Suligoj, Tomislav, HRZZ ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Tomislav Suligoj (autor)

Avatar Url Ivan Berdalović (autor)

Avatar Url Mirko Poljak (autor)

Poveznice na cjeloviti tekst rada:

doi

Citiraj ovu publikaciju:

Berdalovic, Ivan; Poljak, Mirko; Suligoj, Tomislav
Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities // IEEE Transactions on Electron Devices, 70 (2023), 3; 1425-1429 doi:10.1109/ted.2023.3239057 (međunarodna recenzija, članak, znanstveni)
Berdalovic, I., Poljak, M. & Suligoj, T. (2023) Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities. IEEE Transactions on Electron Devices, 70 (3), 1425-1429 doi:10.1109/ted.2023.3239057.
@article{article, author = {Berdalovic, Ivan and Poljak, Mirko and Suligoj, Tomislav}, year = {2023}, pages = {1425-1429}, DOI = {10.1109/ted.2023.3239057}, keywords = {2-D electron gas (2DEG), charge carrier mobility, gallium nitride (GaN), heterojunctions, high electron mobility transistors (HEMTs), power semiconductor devices, semiconductor device modeling}, journal = {IEEE Transactions on Electron Devices}, doi = {10.1109/ted.2023.3239057}, volume = {70}, number = {3}, issn = {0018-9383}, title = {Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities}, keyword = {2-D electron gas (2DEG), charge carrier mobility, gallium nitride (GaN), heterojunctions, high electron mobility transistors (HEMTs), power semiconductor devices, semiconductor device modeling} }
@article{article, author = {Berdalovic, Ivan and Poljak, Mirko and Suligoj, Tomislav}, year = {2023}, pages = {1425-1429}, DOI = {10.1109/ted.2023.3239057}, keywords = {2-D electron gas (2DEG), charge carrier mobility, gallium nitride (GaN), heterojunctions, high electron mobility transistors (HEMTs), power semiconductor devices, semiconductor device modeling}, journal = {IEEE Transactions on Electron Devices}, doi = {10.1109/ted.2023.3239057}, volume = {70}, number = {3}, issn = {0018-9383}, title = {Theoretical Prediction of Mobility Improvement in GaN-Based HEMTs at High Carrier Densities}, keyword = {2-D electron gas (2DEG), charge carrier mobility, gallium nitride (GaN), heterojunctions, high electron mobility transistors (HEMTs), power semiconductor devices, semiconductor device modeling} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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