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Pregled bibliografske jedinice broj: 1246794

Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain


Sunjerga, Antonio; Rubinstein, Marcos; Poljak, Dragan; Karami, Hamidreza; Rachidi, Farhad
Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain // IEEE transactions on electromagnetic compatibility, 62 (2020), 5; 1889-1892 doi:10.1109/temc.2020.2974579 (međunarodna recenzija, članak, znanstveni)


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Naslov
Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain

Autori
Sunjerga, Antonio ; Rubinstein, Marcos ; Poljak, Dragan ; Karami, Hamidreza ; Rachidi, Farhad

Izvornik
IEEE transactions on electromagnetic compatibility (0018-9375) 62 (2020), 5; 1889-1892

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain

Sažetak
In this letter, we present an analytical solution for the resistance of a hemispheric grounding electrode located on the top of a mountain. The mountain is modeled as a truncated cone with a finite height. Recently, a closed-form solution for the grounding resistance was derived first for a hemispheric electrode on top of a cone and later for a more realistic case of a truncated cone with a flat region at its top. The height of the cone was considered infinite in those studies. Here, we extend these studies for the case of a truncated cone with finite height. The analytical solution is compared with numerical simulations and the results agree reasonably well.

Izvorni jezik
Engleski



POVEZANOST RADA


Profili:

Avatar Url Dragan Poljak (autor)

Avatar Url Antonio Šunjerga (autor)

Poveznice na cjeloviti tekst rada:

doi

Citiraj ovu publikaciju:

Sunjerga, Antonio; Rubinstein, Marcos; Poljak, Dragan; Karami, Hamidreza; Rachidi, Farhad
Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain // IEEE transactions on electromagnetic compatibility, 62 (2020), 5; 1889-1892 doi:10.1109/temc.2020.2974579 (međunarodna recenzija, članak, znanstveni)
Sunjerga, A., Rubinstein, M., Poljak, D., Karami, H. & Rachidi, F. (2020) Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain. IEEE transactions on electromagnetic compatibility, 62 (5), 1889-1892 doi:10.1109/temc.2020.2974579.
@article{article, author = {Sunjerga, Antonio and Rubinstein, Marcos and Poljak, Dragan and Karami, Hamidreza and Rachidi, Farhad}, year = {2020}, pages = {1889-1892}, DOI = {10.1109/temc.2020.2974579}, keywords = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain}, journal = {IEEE transactions on electromagnetic compatibility}, doi = {10.1109/temc.2020.2974579}, volume = {62}, number = {5}, issn = {0018-9375}, title = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain}, keyword = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain} }
@article{article, author = {Sunjerga, Antonio and Rubinstein, Marcos and Poljak, Dragan and Karami, Hamidreza and Rachidi, Farhad}, year = {2020}, pages = {1889-1892}, DOI = {10.1109/temc.2020.2974579}, keywords = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain}, journal = {IEEE transactions on electromagnetic compatibility}, doi = {10.1109/temc.2020.2974579}, volume = {62}, number = {5}, issn = {0018-9375}, title = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain}, keyword = {Grounding Resistance of a Hemispheric Electrode Located on the Top of a Finite-Height, Cone-Shaped Mountain} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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