Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 121071

Early stages of bubble formation in helium-implanted (100) silicon


Pivac, Branko; Milat, Ognjen; Dubček, Pavo; Bernstorff, Sigrid; Corni, Federico; Nobili, C.; Tonini, Rita
Early stages of bubble formation in helium-implanted (100) silicon // Physica status solidi. A, Applied research, 198 (2003), 1; 29-37 doi:10.1002/pssa.200306457 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 121071 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Early stages of bubble formation in helium-implanted (100) silicon

Autori
Pivac, Branko ; Milat, Ognjen ; Dubček, Pavo ; Bernstorff, Sigrid ; Corni, Federico ; Nobili, C. ; Tonini, Rita

Izvornik
Physica status solidi. A, Applied research (0031-8965) 198 (2003), 1; 29-37

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
silicon ; defects ; ion implantation ; impurities ; helium

Sažetak
Early stages of bubble formation in Czochralski grown, (100)-oriented silicon are investigated by implanting 2x10E16 He+ cm-2 at 20 keV and treating the samples in the temperature range 100 - 450 oC. Elastic recoil detection is used to measure the helium content and depth distribution, while the gas release is studied by Thermal desorption spectrometry. To evidence the radiation damage evolution and the defect behavior, the results from Rutherford backscattering spectrometry in channeling conditions, cross sectional Transmission electron microscopy, and grazing incidence small angle X-ray scattering are critically analyzed and compared. The study leads to the identification of the steps followed by the defects during annealing and suggests that critical condition for production of stable bubbles is the presence at low temperature of agglomerates composed of more than four vacancies decorated by helium. This kind of defect offers helium the room necessary to transform into gas phase and confer thermal stability to the bubble embryos.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
0098020
0035012

Ustanove:
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Pavo Dubček (autor)

Avatar Url Ognjen Milat (autor)

Avatar Url Branko Pivac (autor)

Poveznice na cjeloviti tekst rada:

doi onlinelibrary.wiley.com

Citiraj ovu publikaciju:

Pivac, Branko; Milat, Ognjen; Dubček, Pavo; Bernstorff, Sigrid; Corni, Federico; Nobili, C.; Tonini, Rita
Early stages of bubble formation in helium-implanted (100) silicon // Physica status solidi. A, Applied research, 198 (2003), 1; 29-37 doi:10.1002/pssa.200306457 (međunarodna recenzija, članak, znanstveni)
Pivac, B., Milat, O., Dubček, P., Bernstorff, S., Corni, F., Nobili, C. & Tonini, R. (2003) Early stages of bubble formation in helium-implanted (100) silicon. Physica status solidi. A, Applied research, 198 (1), 29-37 doi:10.1002/pssa.200306457.
@article{article, author = {Pivac, Branko and Milat, Ognjen and Dub\v{c}ek, Pavo and Bernstorff, Sigrid and Corni, Federico and Nobili, C. and Tonini, Rita}, year = {2003}, pages = {29-37}, DOI = {10.1002/pssa.200306457}, keywords = {silicon, defects, ion implantation, impurities, helium}, journal = {Physica status solidi. A, Applied research}, doi = {10.1002/pssa.200306457}, volume = {198}, number = {1}, issn = {0031-8965}, title = {Early stages of bubble formation in helium-implanted (100) silicon}, keyword = {silicon, defects, ion implantation, impurities, helium} }
@article{article, author = {Pivac, Branko and Milat, Ognjen and Dub\v{c}ek, Pavo and Bernstorff, Sigrid and Corni, Federico and Nobili, C. and Tonini, Rita}, year = {2003}, pages = {29-37}, DOI = {10.1002/pssa.200306457}, keywords = {silicon, defects, ion implantation, impurities, helium}, journal = {Physica status solidi. A, Applied research}, doi = {10.1002/pssa.200306457}, volume = {198}, number = {1}, issn = {0031-8965}, title = {Early stages of bubble formation in helium-implanted (100) silicon}, keyword = {silicon, defects, ion implantation, impurities, helium} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





    Contrast
    Increase Font
    Decrease Font
    Dyslexic Font