Naslov
Detection of insect pest infestation stress in winter wheat using proximal spectroscopic measurements

Autori
Skendžić, Sandra ; Zovko, Monika ; Pajač Živković, Ivana ; Lešić, Vinko ; Novak, Hrvoje ; Lemić, Darija

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
20th ICC Conference 2022 “Future Challenges for Cereal Science and Technology” Book of Abstracts / ICC International Association for Cereal Science and Technology - Beč : ICC – International Association for Cereal Science and Technology, 2022, 75-76

ISBN
978-3-900397-02-9

Skup
20th ICC Conference 2022: Future Challenges for Cereal Science and Technology

Mjesto i datum
Beč, Austrija, 05.07.2022. - 07.07.2022

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Remote sensing ; spectroradiometer ; winter wheat ; insect pest ; reflectance data

Sažetak
Climate change and extreme weather events have significant impacts on winter wheat (Triticum aestivum L.) production and its arthropod pests. Under these new climatic conditions, pest infestations are expected to be severe. Insects tend to reduce the photosynthetic activity of wheat plants and negatively affect their growth and development, ultimately leading to even greater yield losses. Inaccurate decision making in an integrated pest management program can result in ineffective control in infested areas. To achieve more effective control of pest populations, it is important to assess infestations in a timely manner to reduce the negative impact on crops. Great efforts have been made to prevent and manage these negative impacts, including remote sensing of damage symptoms. Proximal remote sensing provides a fast, accurate, non-invasive, and simple method for monitoring and assessing pest damage to various crops. The efficiency of pest monitoring in the field could be improved by knowing the solar radiation reflected from the leaves and canopies of winter wheat. Canopy and leaf reflectance is measured using a spectroradiometer in the wavelength range of 350-2500 nm on experimental crops of five winter wheat cultivars at crucial phenophases. This summary represents an ongoing research effort aimed at detecting stress caused by insect pests and evaluating stress levels in different winter wheat cultivars. Chemometric analysis of spectral response patterns is used to isolate sensitive wavelengths that indicate early signs of infestation. Results of similar studies showed that spectral reflectance of leaves in the visible (VIS, 350-700 nm) and near infrared (NIR, 700-1300 nm) range decreased with increasing aphid infestation and that there were significant differences in blue, green, red, NIR, and shortwave infrared (SWIR) between different severity levels of aphid infestation. The spectroradiometric method can also be used to test the commonly used spectral vegetation indices (e.g. NDVI, RVI, etc.) as indicators of stress in winter wheat cultivars. The results obtained made it possible to distinguish the different levels of infestation and to distinguish healthy wheat plants from insect-infested plants based on their reflectance.

Izvorni jezik
Engleski

Znanstvena područja
Poljoprivreda (agronomija), Interdisciplinarne biotehničke znanosti

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