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Pregled bibliografske jedinice broj: 1187578

Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker


(CMS Collaboration) Adam, W.; ...; Brigljević, Vuko; Ferenček, Dinko; Majumder, Devdatta; Mishra, Saswat; Roguljić, Matej; Starodumov, Andrey; Šuša, Tatjana; ...; D'Angelo, P.
Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker // Journal of Instrumentation, 16 (2021), 11; P11028, 41 doi:10.1088/1748-0221/16/11/P11028 (međunarodna recenzija, članak, znanstveni)


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Naslov
Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker

Autori
Adam, W. ; ... ; Brigljević, Vuko ; Ferenček, Dinko ; Majumder, Devdatta ; Mishra, Saswat ; Roguljić, Matej ; Starodumov, Andrey ; Šuša, Tatjana ; ... ; D'Angelo, P.

Kolaboracija
CMS Collaboration

Izvornik
Journal of Instrumentation (1748-0221) 16 (2021), 11; P11028, 41

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
High energy physics ; Experimental particle physics ; LHC ; CMS ; Radiation-hard detectors ; Si microstrip and pad detectors ; Radiation damage to detector materials (solid state) ; Particle tracking detectors (Solid-state detectors) ; radiation: damage ; CMS: upgrade ; tracking detector ; semiconductor detector: design ; semiconductor detector: microstrip ; performance

Sažetak
During the operation of the CMS experiment at the High-Luminosity LHC the silicon sensors of the Phase-2 Outer Tracker will be exposed to radiation levels that could potentially deteriorate their performance. Previous studies had determined that planar float zone silicon with n-doped strips on a p-doped substrate was preferred over p-doped strips on an n-doped substrate. The last step in evaluating the optimal design for the mass production of about 200 m2 of silicon sensors was to compare sensors of baseline thickness (about 300 μm) to thinned sensors (about 240 μm), which promised several benefits at high radiation levels because of the higher electric fields at the same bias voltage. This study provides a direct comparison of these two thicknesses in terms of sensor characteristics as well as charge collection and hit efficiency for fluences up to 1.5 × 1015 neq/cm2. The measurement results demonstrate that sensors with about 300 μm thickness will ensure excellent tracking performance even at the highest considered fluence levels expected for the Phase-2 Outer Tracker.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Institut "Ruđer Bošković", Zagreb

Citiraj ovu publikaciju:

(CMS Collaboration) Adam, W.; ...; Brigljević, Vuko; Ferenček, Dinko; Majumder, Devdatta; Mishra, Saswat; Roguljić, Matej; Starodumov, Andrey; Šuša, Tatjana; ...; D'Angelo, P.
Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker // Journal of Instrumentation, 16 (2021), 11; P11028, 41 doi:10.1088/1748-0221/16/11/P11028 (međunarodna recenzija, članak, znanstveni)
(CMS Collaboration) (CMS Collaboration) Adam, W., ..., Brigljević, V., Ferenček, D., Majumder, D., Mishra, S., Roguljić, M., Starodumov, A., Šuša, T., ... & D'Angelo, P. (2021) Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker. Journal of Instrumentation, 16 (11), P11028, 41 doi:10.1088/1748-0221/16/11/P11028.
@article{article, author = {Adam, W. and Brigljevi\'{c}, Vuko and Feren\v{c}ek, Dinko and Majumder, Devdatta and Mishra, Saswat and Rogulji\'{c}, Matej and Starodumov, Andrey and \v{S}u\v{s}a, Tatjana and D'Angelo, P.}, year = {2021}, pages = {41}, DOI = {10.1088/1748-0221/16/11/P11028}, chapter = {P11028}, keywords = {High energy physics, Experimental particle physics, LHC, CMS, Radiation-hard detectors, Si microstrip and pad detectors, Radiation damage to detector materials (solid state), Particle tracking detectors (Solid-state detectors), radiation: damage, CMS: upgrade, tracking detector, semiconductor detector: design, semiconductor detector: microstrip, performance}, journal = {Journal of Instrumentation}, doi = {10.1088/1748-0221/16/11/P11028}, volume = {16}, number = {11}, issn = {1748-0221}, title = {Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker}, keyword = {High energy physics, Experimental particle physics, LHC, CMS, Radiation-hard detectors, Si microstrip and pad detectors, Radiation damage to detector materials (solid state), Particle tracking detectors (Solid-state detectors), radiation: damage, CMS: upgrade, tracking detector, semiconductor detector: design, semiconductor detector: microstrip, performance}, chapternumber = {P11028} }
@article{article, author = {Adam, W. and Brigljevi\'{c}, Vuko and Feren\v{c}ek, Dinko and Majumder, Devdatta and Mishra, Saswat and Rogulji\'{c}, Matej and Starodumov, Andrey and \v{S}u\v{s}a, Tatjana and D'Angelo, P.}, year = {2021}, pages = {41}, DOI = {10.1088/1748-0221/16/11/P11028}, chapter = {P11028}, keywords = {High energy physics, Experimental particle physics, LHC, CMS, Radiation-hard detectors, Si microstrip and pad detectors, Radiation damage to detector materials (solid state), Particle tracking detectors (Solid-state detectors), radiation: damage, CMS: upgrade, tracking detector, semiconductor detector: design, semiconductor detector: microstrip, performance}, journal = {Journal of Instrumentation}, doi = {10.1088/1748-0221/16/11/P11028}, volume = {16}, number = {11}, issn = {1748-0221}, title = {Selection of the silicon sensor thickness for the Phase-2 upgrade of the CMS Outer Tracker}, keyword = {High energy physics, Experimental particle physics, LHC, CMS, Radiation-hard detectors, Si microstrip and pad detectors, Radiation damage to detector materials (solid state), Particle tracking detectors (Solid-state detectors), radiation: damage, CMS: upgrade, tracking detector, semiconductor detector: design, semiconductor detector: microstrip, performance}, chapternumber = {P11028} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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