Naslov
HIGH RESOLUTION AES ANALYSIS AND IMAGING OF In20Sn80 OXIDIZED SURFACE USING FIELD EMISSION AUGER MICROPROBE

Autori
Jenko, Monika ; Erjavec, Bojan ; Milun, Milorad

Izvornik
Vacuum (0042-207X) 71 (2003); 19-25

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
In20Sn80; oxidation; fluxless vacuum soldering; high resolution auger electron spectroscopy; In2O3 dissociation

Sažetak
In this study, for the first time, it is shown how the heating of an In20Sn80 alloy affects its morphology and surface chemical composition. The study of the initial phases of surface oxidation of the pure In20Sn80 alloy at the room temperature revealed the formation of a mixture of In2O3, SnO and SnO2 oxides with a dominant contribution of In2O3. The high spatial resolution of the Auger spectrometer enabled one to examine the fine details at various spots on the surface. The results vary from one point of analysis to another. The statistical analysis of a large number of spectra shows clearly an enrichment in the In content in both oxide layer and the clean sample obtained after the oxide layer is removed by heating the sample at 400o C. The thickness of the oxide layer, approximately 3.5 nm, was estimated by AES depth profiling analysis.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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