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Pregled bibliografske jedinice broj: 1159574

Determination of second-generation current conveyor noise-model parameters

Alanović, Matija; Jurišić, Dražen; Moschytz, George S.
Determination of second-generation current conveyor noise-model parameters // Proceedings of the 2017 European Conference on Circuit Theory and Design (ECCTD) / Giustolisi, Gianluca et al. (ur.).
Catania: Institute of Electrical and Electronics Engineers (IEEE), 2017. str. 1-4 doi:10.1109/ECCTD.2017.8093357 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)

CROSBI ID: 1159574 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Determination of second-generation current conveyor noise-model parameters

Autori
Alanović, Matija ; Jurišić, Dražen ; Moschytz, George S.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the 2017 European Conference on Circuit Theory and Design (ECCTD) / Giustolisi, Gianluca et al. - Catania : Institute of Electrical and Electronics Engineers (IEEE), 2017, 1-4

ISBN
978-1-5386-3974-0

Skup
2017 European Conference on Circuit Theory and Design (ECCTD)

Mjesto i datum
Catania, Italija, 04.09.2017. - 06.09.2017

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
SPICE ; Thermal noise ; Impedance ; Transistors ; Semiconductor device modeling ; Equivalent circuits ; Integrated circuit modeling

Sažetak
A general method of determining the parameters for a well-known noise model of a second-generation current conveyor (CCII) is presented. The method is used to determine the thermal noise model parameters for two different CMOS CCII implementations. The simulation is carried out with the parameters of the AMS 0.35 μm technology using PSpice. For one of the analyzed implementations, the thermal noise model parameters are also derived analytically. They are shown to be in good agreement with the ones obtained by simulation.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA

Projekti:
HRZZ-IP-2016-06-1307 - Frakcionalni analogni i mješoviti sustavi obrade signala (FractalAnalogFilters) (Jurišić, Dražen, HRZZ ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Dražen Jurišić (autor)

Poveznice na cjeloviti tekst rada:

doi ieeexplore.ieee.org

Citiraj ovu publikaciju:

Alanović, Matija; Jurišić, Dražen; Moschytz, George S.
Determination of second-generation current conveyor noise-model parameters // Proceedings of the 2017 European Conference on Circuit Theory and Design (ECCTD) / Giustolisi, Gianluca et al. (ur.).
Catania: Institute of Electrical and Electronics Engineers (IEEE), 2017. str. 1-4 doi:10.1109/ECCTD.2017.8093357 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Alanović, M., Jurišić, D. & Moschytz, G. (2017) Determination of second-generation current conveyor noise-model parameters. U: Giustolisi, G. (ur.)Proceedings of the 2017 European Conference on Circuit Theory and Design (ECCTD) doi:10.1109/ECCTD.2017.8093357.
@article{article, author = {Alanovi\'{c}, Matija and Juri\v{s}i\'{c}, Dra\v{z}en and Moschytz, George S.}, editor = {Giustolisi, G.}, year = {2017}, pages = {1-4}, DOI = {10.1109/ECCTD.2017.8093357}, keywords = {SPICE, Thermal noise, Impedance, Transistors, Semiconductor device modeling, Equivalent circuits, Integrated circuit modeling}, doi = {10.1109/ECCTD.2017.8093357}, isbn = {978-1-5386-3974-0}, title = {Determination of second-generation current conveyor noise-model parameters}, keyword = {SPICE, Thermal noise, Impedance, Transistors, Semiconductor device modeling, Equivalent circuits, Integrated circuit modeling}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Catania, Italija} }
@article{article, author = {Alanovi\'{c}, Matija and Juri\v{s}i\'{c}, Dra\v{z}en and Moschytz, George S.}, editor = {Giustolisi, G.}, year = {2017}, pages = {1-4}, DOI = {10.1109/ECCTD.2017.8093357}, keywords = {SPICE, Thermal noise, Impedance, Transistors, Semiconductor device modeling, Equivalent circuits, Integrated circuit modeling}, doi = {10.1109/ECCTD.2017.8093357}, isbn = {978-1-5386-3974-0}, title = {Determination of second-generation current conveyor noise-model parameters}, keyword = {SPICE, Thermal noise, Impedance, Transistors, Semiconductor device modeling, Equivalent circuits, Integrated circuit modeling}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Catania, Italija} }

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