Pregled bibliografske jedinice broj: 1150177
Energy retention in swift heavy ion irradiated thin graphite films
Energy retention in swift heavy ion irradiated thin graphite films // IBA&PIXE-SIMS 2021 : abstract and programme booklet
London : Delhi, 2021. str. 99-99 (poster, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 1150177 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Energy retention in swift heavy ion irradiated thin
graphite films
Autori
Iveković, Damjan ; Žugec, Petar ; Karlušić, Marko
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
IBA&PIXE-SIMS 2021 : abstract and programme booklet
/ - London : Delhi, 2021, 99-99
Skup
17th International Conference on Particle Induce X-ray Emission ; International Conference on Secondary Ion Mass Spectrometry (IBA/PIXE & SIMS 2021)
Mjesto i datum
Online, 11.10.2021. - 15.10.2021
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
graphite ; Geant4 ; ion irradiation
Sažetak
Swift heavy ion (SHI) beams are a unique tool for materials nanostructuring with diverse uses such as nanomembrane production, catalysis, sensing or optical waveguide fabrication. All of these applications are enabled by the material damage produced along the SHI path. Current understanding of this damage formation in insulators and semiconductors is based on the thermal spike model, that intense electronic excitation caused by SHI passage can lead to material heating via electron-phonon coupling. If deposited energy is sufficiently high, this can lead to material melting and ultimately to formation of permanent damage, as defects remain “frozen” during rapid cooling. SHI beams have also been found to be very useful in 2D materials nanostructuring. For example, perforation of graphene has been found in wide range of energies (1-3) and production of graphene nanomembranes in this way has been successfully demonstrated (4). Still, it remains an open question if damage formation in graphene and similar 2D materials can proceed in the above manner. More specifically, SHI impact in 2D material and thin film targets, could be less damaging because deposited energy can dissipate away by emitted secondary electrons. Here we present results of our analyses, based on Geant4 simulations, of energy dissipation in thin graphite and silicon targets. We found that even for the thinnest targets in our study, the majority of the deposited energy still remains within the target.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
HRZZ-IP-2018-01-2786 - Dinamika defekta u nanomaterijalima: istraživanje putem eksperimenata s ionskim tragovima (DyNaMITE++) (Karlušić, Marko, HRZZ - 2018-01) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb