Pregled bibliografske jedinice broj: 1134187
Minimum Contact Resistance in Monoelemental 2D Material Nanodevices with Edge-Contacts
Minimum Contact Resistance in Monoelemental 2D Material Nanodevices with Edge-Contacts // IEEE Electron Device Letters, 42 (2021), 8; 1240-1243 doi:10.1109/LED.2021.3087908 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 1134187 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Minimum Contact Resistance in Monoelemental 2D Material Nanodevices with Edge-Contacts
Autori
Poljak, Mirko ; Matić, Mislav ; Zeljko, Ante
Izvornik
IEEE Electron Device Letters (0741-3106) 42
(2021), 8;
1240-1243
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
2D materials , contact resistance , edge contact , germanene , graphene , phosphorene , quantum transport , silicene
Sažetak
We use atomistic quantum transport device simulations to investigate the contact resistance (RC) in monoelemental 2D material nanoribbon MOSFETs with edge contacts. The consequences of attaching metal electrodes to source/drain regions are investigated for various metal-channel interaction strengths and nanoribbon dimensions. We find that RC is minimized by using moderately interacting metallic materials, and that the minimum RC is ~150 Ω∙μm in graphene, silicene and germanene, and ~430 Ω∙μm in phosphorene nanodevices with edge contacts.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
HRZZ-UIP-2019-04-3493 - Računalno projektiranje nanotranzistora temeljenih na novim 2D materijalima (CONAN2D) (Poljak, Mirko, HRZZ ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
