Naslov
Grazing-incidence small-angle X-ray scattering of synchrotron light on nanostructured V/Ce oxide films intercalated with Li+ ions

Autori
Posedel, Dario ; Dubček, Pavo ; Turković, Aleksandra ; Crnjak Orel, Zorica

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Twelfth Croatian-Slovenian Crystallographic Meeting, Book of abstracts, Programme / Cetina, Mario ; Kajfež, Tanja ; Popović, Stanko ; Štefanić, Zoran - Zagreb : Hrvatska akademija znanosti i umjetnosti (HAZU) ; Hrvatska Kristalografska Zajednica, 2003

Skup
Twelfth Croatian-Slovenian Crystallographic Meeting

Mjesto i datum
NP Plitvička jezera, Hrvatska, 19.06.2003. - 22.06.2003

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Nije recenziran

Ključne riječi
GISAXS; GIXR; nanofazni filmovi

Sažetak
Vanadium oxide, such as V2O5, has been extensively studied because it tends to form a lamellar structure that allows the intercalation/de-intercalation of different ions between its layers. It can be used as a catalyst, in electrochromic devices, in an advanced electrochemical cell concept, especially in lithium batteries [C.G.Granquist, Handbook of Inorganic Electrochromic Materials, Elsevier, Amsterdam, 1995]. The addition of cerium improved stability of vanadium oxide with the ion-charge capacity (up to 30 mC cm-2). The intercalation of Li+ ions in V/Ce films was followed by FT-IR spectroscopy in combination with CV measurements at wide potential range [Z.Crnjak-Orel, I.Mušević, Nanostructured Materials, 12 (1999) 399]. GISAXS (grazing-incidence small-angle x-ray scattering) data for vanadium oxide and V/Ce nanostructured oxide films were taken with a Gabriel type, gas filled 1D and/or 2D detectors at synchrotron ELETTRA, Trieste. GISAXS data for V2O5 and mixed V/Ce oxides were taken in a sequence of fixed grazing angles [A.Turković, Z.Crnjak-Orel and P.Dubček, Materials Science & Engineering B79/1, (2001) 11, D.Posedel, A.Turković, P.Dubček and Z.Crnjak-Orel, Materials Science & Engineering B90, (2002)154]. Illustration is showing three-dimensional plot of GISAXS for V/Ce oxide at 38 at. % of V. Circles (m) are denoting reflectivity peaks for GIXR (grazing-incidence x-ray reflectivity) analyse, which reveals layers thickness. The average grain radius <R> obtained by GISAXS was correlated with layer thickness. The aim of this work is GISAXS study of grain sizes in vanadium oxide and V/Ce oxide at 38 and 71 at. % of V, which may change upon the intercalation of Li+ ions.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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