Naslov
Investigation of light-emission and avalanche- current mechanisms in PureB SPAD devices

Autori
Nanver, Lis K. ; Krakers, Max ; Knezevic, Tihomir ; Karavidas, A. ; Agarwal, Vishal ; Hueting, Ray ; Dutta, Satadal ; Boturchuk, Ievgen ; Annema, Anne-Johan

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), ostalo

Izvornik
Proceedings Volume 11043, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems / - : SPIE, 2019

Skup
Fifth Conference on Sensors, MEMS, and Electro-Optic Systems

Mjesto i datum
Skukuza, Južnoafrička Republika, 08.10.2018. - 10.10.2018

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
avalanche breakdown, defects, light-emitting diode (LED), Pure boron, silicon, single-photon avalanche diode (SPAD)

Sažetak
The light emission from silicon PureB photodiodes was investigated in both forward- and avalanchemode operation and correlated to the presence of process-dependent defects that influence the reverse IV characteristics. As opposed to “defect-free” diodes with low dark currents and abrupt breakdown behavior, the diodes with defects had higher current levels and light-emitting spots appearing at voltages far below the breakdown voltage otherwise set by the implemented doping profiles. The role of such defect-related behavior for the application of the photodiodes as single-photon avalanche diodes (SPADs) and avalanche-mode light-emitting diodes (AMLEDs) is assessed in connection with the recent demonstration of these basic devices as both the light-emitting and light-detecting elements in optocoupler circuits integrated in CMOS for data transmission purposes.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika

POVEZANOST RADA