Pregled bibliografske jedinice broj: 1086576
Diode design for studying material defect distributions with avalanche–mode light emission
Diode design for studying material defect distributions with avalanche–mode light emission // 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
Edinburgh, Ujedinjeno Kraljevstvo: Institute of Electrical and Electronics Engineers (IEEE), 2020. 9.2, 6 doi:10.1109/icmts48187.2020.9107933 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 1086576 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Diode design for studying material defect
distributions with avalanche–mode light emission
Autori
Krakers, M. ; Knežević, T. ; Batenburg, K.M. ; Liu, X. ; Nanver, L.K.
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
/ - : Institute of Electrical and Electronics Engineers (IEEE), 2020
Skup
33rd International Conference on Microelectronic Test Structures (ICMTS)
Mjesto i datum
Edinburgh, Ujedinjeno Kraljevstvo, 04.05.2020. - 18.05.2020
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
avalanche diode, SPAD, PureB, light emission, defects
Sažetak
Avalanche-mode visual light emission in Si diodes is shown to be useful for rapid assessment of the origin of non-ideal currents. In the test structure design, it was important to consider the breakdown-voltage distribution, diode size and contact positioning to obtain light-spot appearances at positions related to bulk defect distributions.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
HRZZ-IP-2018-01-5296 - Nova generacija poluvodičkih elemenata i integriranih sklopova za eru Interneta stvari (NexGenSemi) (Suligoj, Tomislav, HRZZ ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Tihomir Knežević
(autor)
