Pregled bibliografske jedinice broj: 1086455
Measurement of RF Linear Operating Area of Bipolar Transistors
Measurement of RF Linear Operating Area of Bipolar Transistors // Ieee microwave and wireless components letters, 30 (2020), 11; 1057-1060 doi:10.1109/LMWC.2020.3027867 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 1086455 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Measurement of RF Linear Operating Area of Bipolar
Transistors
Autori
Osrečki, Željko ; Žilak, Josip ; Koričić, Marko ; Suligoj, Tomislav
Izvornik
Ieee microwave and wireless components letters (1531-1309) 30
(2020), 11;
1057-1060
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Bipolar transistors , horizontal current bipolar transistor (HCBT) , knee voltage , linearity , maximum collector current , radio frequency (RF) power amplifiers (PAs) , safe operating area , silicon-germanium heterojunction bipolar transistor (SiGe HBT).
Sažetak
The methodology for the measurement of the knee voltage and maximum collector current for the linear operation of bipolar transistors is described and demonstrated on the horizontal current bipolar transistor (HCBT). Both limits are determined by measuring loadlines at 1-dB compression point (P1dB), wherein the hard- limiting nonlinearity occurs only in the positive half-wave of the collector current. The boundary defines the knee voltage, maximum collector current, and the transition between the two in which the onset of the Kirk effect takes place. It is found that the maximum collector current boundary saturates at a constant value for higher collector-emitter voltages and that there are the optimum load impedance and bias point for the maximum output power in the linear regime. They are found for HCBT, which achieves the output power of 21.25 dBm (P1dB) at 2.4 GHz, with the maximum collector-emitter voltage set to the open- emitter breakdown voltage of 9 V.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
HRZZ-IP-2018-01-5296 - Nova generacija poluvodičkih elemenata i integriranih sklopova za eru Interneta stvari (NexGenSemi) (Suligoj, Tomislav, HRZZ ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus