Pregled bibliografske jedinice broj: 1085710
An Approach to the Determination of the Reliability of Semiconductor Memory Systems
An Approach to the Determination of the Reliability of Semiconductor Memory Systems // Microsystem '85 / Janeš, Vlastimil (ur.).
Prag: Czechoslovak Scientific and Technical Society, 1985. str. 40-44 (predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 1085710 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
An Approach to the Determination of the
Reliability of Semiconductor Memory Systems
Autori
Nožica, Žarko
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Microsystem '85
/ Janeš, Vlastimil - Prag : Czechoslovak Scientific and Technical Society, 1985, 40-44
Skup
Mikrosystem '85
Mjesto i datum
Tábor, Češka Republika, 28.10.1985. - 31.10.1985
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Memory Reliability, Memory Building Block, Modeling,
(Reliability, Memory, Modeling,)
Sažetak
Abstract: The approach for the increase and determination of the memory system reliability is presented. The paper starts with the development of the reliability model of the basic memory array. It is upgraded to the models suitable for the analysls of more complex systems imploying techniques such as hardware redundancies, error correcting codes, software error correcting algorithms. The models incorporate also the effects of faults masked by data. The developed models are particularly useful for the estimation of the semiconductor memories reliability. The results suggest that the erasure correction method render the optimal reliability.
Izvorni jezik
Engleski
Znanstvena područja
Računarstvo
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Žarko Nožica
(autor)
