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Pregled bibliografske jedinice broj: 1064578

Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions

Stachura, R.; Kubala-Kukuś, A.; Banaś, D.; Stabrawa, I.; Szary, K.; Jagodziński, P.; Aquilanti, G.; Božičević Mihalić, Iva; Pajek, M.; Semaniak, J.; Teodorczyk, M.
Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions // Acta Physica Polonica. A, 137 (2020), 1; 38-43 doi:10.12693/aphyspola.137.38 (recenziran, članak, znanstveni)

CROSBI ID: 1064578 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions

Autori
Stachura, R. ; Kubala-Kukuś, A. ; Banaś, D. ; Stabrawa, I. ; Szary, K. ; Jagodziński, P. ; Aquilanti, G. ; Božičević Mihalić, Iva ; Pajek, M. ; Semaniak, J. ; Teodorczyk, M.

Izvornik
Acta Physica Polonica. A (0587-4246) 137 (2020), 1; 38-43

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
titanium dioxide ; nanolayers ; highly charged Xe ions

Sažetak
In this work synchrotron radiation based X-ray reflectometry method was applied for determination of morphology of TiO2 nanolayers, unmodified, and irradiated with low energy highly charged Xeq+ ions. Using the synchrotron radiation based X-ray reflectometry technique density, thickness, and roughness of the TiO2 nanolayers were determined. The results showed that the thicknesses of the nanolayers obtained with synchrotron radiation based X-ray reflectometry method agree within the experimental uncertainty with the declared thicknesses. Moreover, the density of the nanolayers is much lower than density of the bulk TiO2 due to their nanometer thickness. The results obtained for irradiated samples suggest possible amorphization and smoothening of the TiO2 nanolayers surface due to interactions of the highly charged ions.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Iva Božičević Mihalić (autor)

Poveznice na cjeloviti tekst rada:

doi przyrbwn.icm.edu.pl fulir.irb.hr

Citiraj ovu publikaciju:

Stachura, R.; Kubala-Kukuś, A.; Banaś, D.; Stabrawa, I.; Szary, K.; Jagodziński, P.; Aquilanti, G.; Božičević Mihalić, Iva; Pajek, M.; Semaniak, J.; Teodorczyk, M.
Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions // Acta Physica Polonica. A, 137 (2020), 1; 38-43 doi:10.12693/aphyspola.137.38 (recenziran, članak, znanstveni)
Stachura, R., Kubala-Kukuś, A., Banaś, D., Stabrawa, I., Szary, K., Jagodziński, P., Aquilanti, G., Božičević Mihalić, I., Pajek, M., Semaniak, J. & Teodorczyk, M. (2020) Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions. Acta Physica Polonica. A, 137 (1), 38-43 doi:10.12693/aphyspola.137.38.
@article{article, author = {Stachura, R. and Kubala-Kuku\'{s}, A. and Bana\'{s}, D. and Stabrawa, I. and Szary, K. and Jagodzi\'{n}ski, P. and Aquilanti, G. and Bo\v{z}i\v{c}evi\'{c} Mihali\'{c}, Iva and Pajek, M. and Semaniak, J. and Teodorczyk, M.}, year = {2020}, pages = {38-43}, DOI = {10.12693/aphyspola.137.38}, keywords = {titanium dioxide, nanolayers, highly charged Xe ions}, journal = {Acta Physica Polonica. A}, doi = {10.12693/aphyspola.137.38}, volume = {137}, number = {1}, issn = {0587-4246}, title = {Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions}, keyword = {titanium dioxide, nanolayers, highly charged Xe ions} }
@article{article, author = {Stachura, R. and Kubala-Kuku\'{s}, A. and Bana\'{s}, D. and Stabrawa, I. and Szary, K. and Jagodzi\'{n}ski, P. and Aquilanti, G. and Bo\v{z}i\v{c}evi\'{c} Mihali\'{c}, Iva and Pajek, M. and Semaniak, J. and Teodorczyk, M.}, year = {2020}, pages = {38-43}, DOI = {10.12693/aphyspola.137.38}, keywords = {titanium dioxide, nanolayers, highly charged Xe ions}, journal = {Acta Physica Polonica. A}, doi = {10.12693/aphyspola.137.38}, volume = {137}, number = {1}, issn = {0587-4246}, title = {Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions}, keyword = {titanium dioxide, nanolayers, highly charged Xe ions} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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