Pregled bibliografske jedinice broj: 1042822
PIXE depth profiling
PIXE depth profiling // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 40-41 (1989), 643-645 doi:10.1016/0168-583X(89)91066-5 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 1042822 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
PIXE depth profiling
Autori
Jakšić, Milko ; Vajić, Mirjana ; Fazinić, Stjepko ; Tadić, Tonči ; Valković, Vladivoj
Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 40-41
(1989);
643-645
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
PIXE ; depth profiling
Sažetak
PIXE measurements done with different proton energies provide results from which concentration depth profiles can be extracted. An aluminium sample with known concentration depth profile of zinc was analysed. The results presented show the usefulness of the method.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Vladivoj Valković
(autor)
Milko Jakšić
(autor)
Tonči Tadić
(autor)
Stjepko Fazinić
(autor)
Mirjana Vajić
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI