Naslov
Multi-element analysis of seminal plasma using total reflection X-ray fluorescence spectroscopy

Autori
Jablan, Jasna ; Dumić, Jerka ; Queralt, Ignazi ; Baković, Lada ; Margui, Eva

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, ostalo, znanstveni

Skup
18th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods

Mjesto i datum
Girona, Španjolska, 25.06.2019. - 28.06.2019

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
seminal plasma, TXRF, multi-element analysis

Sažetak
Seminal plasma (SP) is composed of secretory products of glands in the male urogenital tract, such as peptides, proteins, lipids, saccharides, inorganic ions, nucleic acids, and small molecule metabolites etc. Consequently, changes in these components might reflect an ongoing pathological process in a specific organ. Therefore, SP represents a “gold mine” of potential biomarkers, which could significantly improve diagnostic/prognostic/treatment protocols, but also contribute to better understanding of molecular mechanisms underlying pathological processes in the male urogenital system. Further, human SP contains a variety of macro-, trace- and ultra-trace elements. Trace elements such as, zinc, copper, and selenium are essential for normal spermatogenesis of mammals and play a critical role in antioxidant defense system thus being associated with sperm quality and inflammation. Consequently, multi-elemental analysis of SP could provide significant information on physiological and pathophysiological processes occurring in male reproductive tract. The aim of this work was to develop a fast and reliable an analytical methodology in combination with a low power benchtop total reflection X-ray fluorescence (TXRF) for multi-element analysis of SP samples. In order to select the best analytical conditions to carry out the analysis of the aforementioned samples by means of TXRF, several experimental parameters regarding the sample preparation and measurement conditions have been evaluated. A study of the shape and element distribution of the deposited residue on the reflector by micro X-ray fluorescence spectrometry was also included. After establishing the optimum conditions of analysis, analytical figures of merit such as the limits of detection, the precision and accuracy of the results have been considered in order to evaluate the possibilities of the developed TXRF methods for the analysis of SP samples.

Izvorni jezik
Engleski

Znanstvena područja
Kemija

POVEZANOST RADA