Pregled bibliografske jedinice broj: 1005251
Helium depth profile measurements within tungsten coatings by using Glow Discharge Optical Emission Spectrometry (GDOES)
Helium depth profile measurements within tungsten coatings by using Glow Discharge Optical Emission Spectrometry (GDOES) // Surface & coatings technology, 376 (2019), 21-24 doi:10.1016/j.surfcoat.2018.11.057 (međunarodna recenzija, članak, znanstveni)
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Naslov
Helium depth profile measurements within tungsten coatings by using Glow Discharge Optical Emission Spectrometry (GDOES)
Autori
Grigore, Eduard ; Ruset, Cristian ; Firdaouss, Mehdi ; .Petersson, Per ; Bogdanović Radović, Ivančica ; Siketić, Zdravko
Izvornik
Surface & coatings technology (0257-8972) 376
(2019);
21-24
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Helium retention ; W coatings ; GDOES
Sažetak
In the present paper results concerning the implementation of the Glow Discharge Optical Emission Spectrometry (GDOES) for measure the He depth profile within W coatings are given. The He emission line situated at 587.5 nm was used in this respect. W coating containing He up 10 at.% and with thickness of 5 μm have been obtained by Combined Magnetron Sputtering and Ion Implantation (CMSII) method. The coatings structure and morphology was investigated using Scanning Electron Microscopy (SEM) measurements. The He retention within the coatings was evaluated by using Thermal Desorption Spectroscopy (TDS). Time- of-Flight Elastic Recoil Detection Analysis (TOF ERDA) measurements has been used to determine chemical composition of the coatings. Results of TOF-ERDA measurements results were used to calibrate the GDOES equipment. Using these data the GDOES depth profiles of the He within W coatings have been obtained.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus