Pregled bibliografske jedinice broj: 941618
Charge multiplication effect in thin diamond films
Charge multiplication effect in thin diamond films // Applied Physics Letters, 109 (2016), 4; 043502, 6 doi:10.1063/1.4959863 (međunarodna recenzija, članak, znanstveni)
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Naslov
Charge multiplication effect in thin diamond films
Autori
Skukan, N. ; Grilj, V. ; Sudić, Ivan ; Pomorski, M. ; Kada, W. ; Makino, T. ; Kambayashi, Y. ; Andoh, Y. ; Onoda, S. ; Sato, S. ; Ohshima, T. ; Kamiya, T. ; Jakšić, M.
Izvornik
Applied Physics Letters (0003-6951) 109
(2016), 4;
043502, 6
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
CVD-diamond ; ionization ; system ; diodes
Sažetak
Herein, we report on the enhanced sensitivity for the detection of charged particles in single crystal chemical vapour deposition (scCVD) diamond radiation detectors. The experimental results demonstrate charge multiplication in thin planar diamond membrane detectors, upon impact of 18MeV O ions, under high electric field conditions. Avalanche multiplication is widely exploited in devices such as avalanche photo diodes, but has never before been reproducibly observed in intrinsic CVD diamond. Because enhanced sensitivity for charged particle detection is obtained for short charge drift lengths without dark counts, this effect could be further exploited in the development of sensors based on avalanche multiplication and radiation detectors with extreme radiation hardness
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- Nature Index