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Pregled bibliografske jedinice broj: 938395

Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth


Kowalczyk, P. J.; Belic, D.; Mahapatra, O.; Brown, S. A.; Kadantsev, E. S.; Woo, T. K.; Ingham, B.; Kozlowski, W.
Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth // Applied Physics Letters, 100 (2012), 15; 151904, 4 doi:10.1063/1.3701166 (međunarodna recenzija, članak, znanstveni)


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Naslov
Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth

Autori
Kowalczyk, P. J. ; Belic, D. ; Mahapatra, O. ; Brown, S. A. ; Kadantsev, E. S. ; Woo, T. K. ; Ingham, B. ; Kozlowski, W.

Izvornik
Applied Physics Letters (0003-6951) 100 (2012), 15; 151904, 4

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
bismuth, XPS, oxidation, dangling bonds, surface oxidation, nanostructures, Fermi surface, thin film structure, surface structure

Sažetak
We present evidence that ultra-thin Bi(110) nanostructures oxidise from the edges, and that their top surfaces remain unoxidised. Even after prolonged oxidation, clean (unoxidised) bismuth is present in nanostructures that are less than 5 monolayers thick. Since the (110) surface of bulk bismuth is known to be readily oxidised, this is strong evidence for a thin film allotrope of bismuth. We present a comparison with calculated structures and the structures of polymeric nitrogen, which suggests that the allotrope is one of several complex or hybrid paired-layer structures.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Profili:

Avatar Url Domagoj Belic (autor)

Poveznice na cjeloviti tekst rada:

doi aip.scitation.org

Citiraj ovu publikaciju:

Kowalczyk, P. J.; Belic, D.; Mahapatra, O.; Brown, S. A.; Kadantsev, E. S.; Woo, T. K.; Ingham, B.; Kozlowski, W.
Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth // Applied Physics Letters, 100 (2012), 15; 151904, 4 doi:10.1063/1.3701166 (međunarodna recenzija, članak, znanstveni)
Kowalczyk, P., Belic, D., Mahapatra, O., Brown, S., Kadantsev, E., Woo, T., Ingham, B. & Kozlowski, W. (2012) Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth. Applied Physics Letters, 100 (15), 151904, 4 doi:10.1063/1.3701166.
@article{article, author = {Kowalczyk, P. J. and Belic, D. and Mahapatra, O. and Brown, S. A. and Kadantsev, E. S. and Woo, T. K. and Ingham, B. and Kozlowski, W.}, year = {2012}, pages = {4}, DOI = {10.1063/1.3701166}, chapter = {151904}, keywords = {bismuth, XPS, oxidation, dangling bonds, surface oxidation, nanostructures, Fermi surface, thin film structure, surface structure}, journal = {Applied Physics Letters}, doi = {10.1063/1.3701166}, volume = {100}, number = {15}, issn = {0003-6951}, title = {Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth}, keyword = {bismuth, XPS, oxidation, dangling bonds, surface oxidation, nanostructures, Fermi surface, thin film structure, surface structure}, chapternumber = {151904} }
@article{article, author = {Kowalczyk, P. J. and Belic, D. and Mahapatra, O. and Brown, S. A. and Kadantsev, E. S. and Woo, T. K. and Ingham, B. and Kozlowski, W.}, year = {2012}, pages = {4}, DOI = {10.1063/1.3701166}, chapter = {151904}, keywords = {bismuth, XPS, oxidation, dangling bonds, surface oxidation, nanostructures, Fermi surface, thin film structure, surface structure}, journal = {Applied Physics Letters}, doi = {10.1063/1.3701166}, volume = {100}, number = {15}, issn = {0003-6951}, title = {Anisotropic oxidation of bismuth nanostructures: Evidence for a thin film allotrope of bismuth}, keyword = {bismuth, XPS, oxidation, dangling bonds, surface oxidation, nanostructures, Fermi surface, thin film structure, surface structure}, chapternumber = {151904} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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