Naslov
New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles

Autori
Dekanić, Krešimir ; Skoko, Željko ; Lončarić, Sven

Izvornik
Acta chimica Slovenica (1318-0207) 63 (2016); 874-880

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Separation of the overlapping diffraction profiles ; differentiation ; Fourier transformation ; X-ray diffraction ; microstructure ; nanomaterials

Sažetak
Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural para- meters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and pre- cise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profi- les overlap each other. Here we present a new method for the separation of the overlapping profiles based on the diffe- rentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sam- ple investigated. The microstructural results obtained by the proposed method are very accurate.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Kemija, Računarstvo

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