Pregled bibliografske jedinice broj: 82854
Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films
Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films // Thin Solid Films, 419 (2002), 105-113 (međunarodna recenzija, članak, znanstveni)
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Naslov
Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films
Autori
Lučić-Lavčević, Magdy ; Turković, Aleksandra
Izvornik
Thin Solid Films (0040-6090) 419
(2002);
105-113
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Small-angle X-ray scattering; Wide-angle X-ray diffraction; Titanium oxide; Nanostructures
Sažetak
Films of nanostructured titanium dioxide (TiO2) on glass substrates, prepared and annealed by different procedures ( sol-gel and chemical vapour deposition) were examined by small-angle X-ray scattering and wide-angle X-ray diffraction. By treating a film as a two-phase system of grains and pores, the corrected relative surface of phases, Svc, was introduced and calculated as a morphological parameter that combine relative surface and the volume fractions of the two phases. Its behaviour during the film annealing was predicted and tested on TiO2 films. The analysis of evolution of films during thermal annealing treatment is given by means of corrected relative surface correlated with grain size and structure.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series
