Naslov
Spectroscopic ellipsometry investigation of the PSS:Na and PEDOT:PSS thin films on silicon

Autori
Pathak, Gaurav ; Čakara, Duško

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
15th Conference of the International Association of Colloid and Interface Scientists : abstracts / - , 2015, Xx-xx

Skup
Conference of the International Association of Colloid and Interface Scientists (15 ; 2015)

Mjesto i datum
Mainz, Njemačka, 24.05.2015. - 29.05.2015

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Spectroscopic ; ellipsometry ; AFM ; PEDOT:PSS ; film ; conductivity

Sažetak
The optical models used for determining the thickness of the thin organic films by means of spectroscopic ellipsometry, involve the dielectric functions of both the film and the solid support materials. Therefore, a reasonable dielectric function model is necessary for simultaneously fitting the optical constants (refractive index, extinction coefficient) and the film thickness. We report the dielectric functions for thin (10 - 150 nm) films of the poly(sulfonatestyrene) sodium salt (PSS:Na) and poly(3, 4-ethylenedioxythiophene) : polystyrene sulfonate (PEDOT:PSS) polyplex, determined from the ellipsometric angles measured in the visible and near infrared regions. The films were prepared by spin-coating the aqueous dispersions on silicon, and their thicknesses were determined by spectroscopic ellipsometry and AFM. The experimentally determined dielectric function of the PSS:Na can be well described with the Lorentz model, applicable for the non-conducting materials, while for PEDOT:PSS, they can be reasonably well described by the Drude-Lorentz model, indicating the presence of the free charge carriers. In both cases, the film thicknesses obtained by fitting the optical models, are in a very good agreement with those measured with AFM.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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