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Pregled bibliografske jedinice broj: 775010

Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy


Siketić, Zdravko; Bogdanović Radović, Ivančica; Jakšić, Milko; Popović Hadžija, Marijana; Hadžija, Mirko;
Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy // Applied physics letters, 107 (2015), 093702-1 doi:10.1063/1.4930062 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 775010 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

Autori
Siketić, Zdravko ; Bogdanović Radović, Ivančica ; Jakšić, Milko ; Popović Hadžija, Marijana ; Hadžija, Mirko ;

Izvornik
Applied physics letters (0003-6951) 107 (2015); 093702-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
submicron molecular imaging; MeV SIMS; STIM

Sažetak
In order to better understand biochemical processes inside an individual cell, it is important to measure the molecular composition at the submicron level. One of the promising mass spectrometry imaging techniques that may be used to accomplish this is Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), using MeV energy heavy ions for excitation. MeV ions have the ability to desorb large intact molecules with a yield that is several orders of magnitude higher than conventional SIMS using keV ions. In order to increase the spatial resolution of the MeV TOF-SIMS system, we propose an independent TOF trigger using a STIM (scanning transmission ion microscopy) detector that is placed just behind the thin transmission target. This arrangement is suitable for biological samples in which the STIM detector simultaneously measures the mass distribution in scanned samples. The capability of the MeV TOF-SIMS setup was demonstrated by imaging the chemical composition of CaCo-2 cells.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Poveznice na cjeloviti tekst rada:

doi dx.doi.org scitation.aip.org

Citiraj ovu publikaciju:

Siketić, Zdravko; Bogdanović Radović, Ivančica; Jakšić, Milko; Popović Hadžija, Marijana; Hadžija, Mirko;
Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy // Applied physics letters, 107 (2015), 093702-1 doi:10.1063/1.4930062 (međunarodna recenzija, članak, znanstveni)
Siketić, Z., Bogdanović Radović, I., Jakšić, M., Popović Hadžija, M., Hadžija, M. & (2015) Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy. Applied physics letters, 107, 093702-1 doi:10.1063/1.4930062.
@article{article, author = {Siketi\'{c}, Zdravko and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Jak\v{s}i\'{c}, Milko and Popovi\'{c} Had\v{z}ija, Marijana and Had\v{z}ija, Mirko}, year = {2015}, pages = {093702-1-093702-5}, DOI = {10.1063/1.4930062}, keywords = {submicron molecular imaging, MeV SIMS, STIM}, journal = {Applied physics letters}, doi = {10.1063/1.4930062}, volume = {107}, issn = {0003-6951}, title = {Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy}, keyword = {submicron molecular imaging, MeV SIMS, STIM} }
@article{article, author = {Siketi\'{c}, Zdravko and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Jak\v{s}i\'{c}, Milko and Popovi\'{c} Had\v{z}ija, Marijana and Had\v{z}ija, Mirko}, year = {2015}, pages = {093702-1-093702-5}, DOI = {10.1063/1.4930062}, keywords = {submicron molecular imaging, MeV SIMS, STIM}, journal = {Applied physics letters}, doi = {10.1063/1.4930062}, volume = {107}, issn = {0003-6951}, title = {Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy}, keyword = {submicron molecular imaging, MeV SIMS, STIM} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus
  • Nature Index


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