Pregled bibliografske jedinice broj: 76247
Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films
Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films // Materials Science and Engineering B, 90 (2002), 154-162 doi:10.1016/S0921-5107(01)00933-3 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 76247 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films
Autori
Posedel, Dario ; Turković, Aleksandra ; Dubček, Pavo ; Crnjak Orel, Zorica
Izvornik
Materials Science and Engineering B (0921-5107) 90
(2002);
154-162
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Grazing-incidence X-ray reflectivity ; Grazing-incidence small-angle X-ray scattering ; Thin films ; V/Ce oxide
Sažetak
Grazing-incidence X-ray reflectivity, Grazing-incidence small-angle X-ray scattering, Thin films, V/Ce oxideanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel dip-coating process. Layer structure in all V/Ce oxides was revealed by grazing-incidence X-ray reflectivity method. The average grain radius <R>, obtained by grazing-icidence small-angle X-ray scattering was correlated with layer thickness.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series
