Pregled bibliografske jedinice broj: 752912
The electronic structure of the α–Ni(OH)2 films: Influence on the production of the high– performance Ni–catalyst surface
The electronic structure of the α–Ni(OH)2 films: Influence on the production of the high– performance Ni–catalyst surface // Journal of power sources, 282 (2015), 421-428 doi:10.1016/j.jpowsour.2015.02.063 (međunarodna recenzija, članak, znanstveni)
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Naslov
The electronic structure of the α–Ni(OH)2 films: Influence on the production of the high– performance Ni–catalyst surface
Autori
Katić, Jozefina ; Metikoš-Huković, Mirjana ; Peter, Robert ; Petravić, Mladen
Izvornik
Journal of power sources (0378-7753) 282
(2015);
421-428
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
nickel-catalyst; n–type α–Ni(OH)2 film; Ni nucleation; hydrogen evolution reaction
Sažetak
In a view of the importance of the solid-state properties of the oxide/hydroxide films on the efficiency of Ni-catalysts, this work is focused on the electronic structure of the passive α- Ni(OH)2 film that behaves as an n-type semiconductor (with anion vacancies as dominant point defects). The solid-state transformation of the n-type α- Ni(OH)2 film to Ni was discussed in the terms of Gerischer’s approach for a reductive decomposition of a classical semiconductor. The kinetics of the α-Ni(OH)2 decomposition to Ni was studied in situ and the decomposition mechanism was proposed. The nickel metal nucleation begins at the anion vacancies on the film|solution interface and finally the whole oxide film matrix transforms to the new metallic phase. The hydrogen evolution reaction (h.e.r.) takes place at a potential more positive than Er(H2/H+) at a freshly, in situ extracted Ni surface. The semiconducting properties of the passive film were compared to those of an oxide film, also n- type semiconductor that is formed on Ni by ion- implantation method. The latter film mentioned shows compact, more ordered and less amorphous structure than the first one what is in accordance to the X-ray photoelectron spectroscopy (XPS) results.
Izvorni jezik
Engleski
Znanstvena područja
Kemija
POVEZANOST RADA
Ustanove:
Fakultet kemijskog inženjerstva i tehnologije, Zagreb,
Sveučilište u Rijeci - Odjel za fiziku
Profili:
Mirjana Metikoš-Huković
(autor)
Jozefina Katić
(autor)
Mladen Petravić
(autor)
Robert Peter
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus