Pregled bibliografske jedinice broj: 74034
Structural-relaxation-induced bondlength and bondangle changes in amorphized Ge
Structural-relaxation-induced bondlength and bondangle changes in amorphized Ge // Physical Review B, 63 (2001) (međunarodna recenzija, članak, znanstveni)
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Naslov
Structural-relaxation-induced bondlength and bondangle changes in amorphized Ge
Autori
Glover, Chris J. ; Ridgway, Mark C. ; Yu, K.M. ; Foran, G.J. ; Desnica-Franković, Dunja Ida ; Clerc, C. ; Hansen, J.L. ; Nylandsted Larsen, A.
Izvornik
Physical Review B 63
(2001);
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
amorphous Ge; EXAFS; structural relaxation; Raman
Sažetak
Low-temperature structural relaxation in amorphised Ge has been characterised by extended X-ray absorption fine structure spectroscopy (EXAFS) and Raman spectroscopy. For the first time, a relaxation-temperature-dependent decrease in the mean value and asymmetry of the interatomic distance distribution has been shown to accompany the well-documented reduction in bondangle distribution. Whilst the initial state of the unrelaxed, as-implanted, amorphous Ge was ion-dose-dependant, relaxation at 200 °C yielded a common ion-dose-independent interatomic distance distribution. The results provide further compelling support for the defect annihilation model of structural relaxation, and imply that the measured heat release on structural relaxation should be implant-condition dependent.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series
