Pregled bibliografske jedinice broj: 693763
Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons
Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons // Proceedings of the International Conference on Ultimate Integration on Silicon (ULIS) 2014 / Mikael Ostling ; Per-Erik Hellstrom ; Gunnar Malm (ur.).
Stockholm: KTH, 2014. str. 1-4 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 693763 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Sensitivity of carrier mobility to edge defects in ultra-narrow graphene nanoribbons
Autori
Poljak, Mirko ; Wang, Kang L. ; Suligoj, Tomislav
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the International Conference on Ultimate Integration on Silicon (ULIS) 2014
/ Mikael Ostling ; Per-Erik Hellstrom ; Gunnar Malm - Stockholm : KTH, 2014, 1-4
Skup
International Conference on Ultimate Integration on Silicon (ULIS) 2014
Mjesto i datum
Stockholm, Švedska, 07.04.2014. - 09.04.2014
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
graphene nanoribbon; mobility; transmission; NEGF; edge defects; variability; sensitivity
Sažetak
We report the results of a multi-scale transport modeling of ultra-narrow GNRs. Atomistic NEGF approach is combined with semiclassical mobility modeling in order to quantify the sensitivity of mobility to edge defects. We find that the mobility in defected GNRs deteriorates more strongly as GNR width is scaled down compared to ideal devices, and that even the minimum mobility variation spans almost one order of magnitude.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Mirko Poljak
(autor)
