Pregled bibliografske jedinice broj: 653489
Metal island film-based structures for sensing using spectrophotometry and ellipsometry
Metal island film-based structures for sensing using spectrophotometry and ellipsometry // Applied physics. A, Materials science & processing, 115 (2014), 2; 481-486 doi:10.1007/s00339-013-8056-x (međunarodna recenzija, članak, znanstveni)
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Naslov
Metal island film-based structures for sensing using spectrophotometry and ellipsometry
Autori
Janicki, Vesna ; Sancho-Parramon, Jordi ; Bosch, Salvador ; Zorc, Hrvoje ; Belarre, Francesc ; Arbiol, Jordi
Izvornik
Applied physics. A, Materials science & processing (0947-8396) 115
(2014), 2;
481-486
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
thin films; sensors; surface plasmon resonsnce; nanocomposites; metal island films
Sažetak
Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Zorc, Hrvoje, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus